SLASF77A December   2022  – September 2023 AFE11612-SEP

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Characteristics
    7. 6.7  Timing Diagrams
    8. 6.8  Typical Characteristics: DAC
    9. 6.9  Typical Characteristics: ADC
    10. 6.10 Typical Characteristics: Internal Reference
    11. 6.11 Typical Characteristics: Temperature Sensor
    12. 6.12 Typical Characteristics: Digital Inputs
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Primary ADC Operation
        1. 7.3.1.1 Analog Inputs
          1. 7.3.1.1.1 Single-Ended Analog Input
          2. 7.3.1.1.2 Fully Differential Input
        2. 7.3.1.2 ADC Trigger Signals (See AFE configuration register 0 )
        3. 7.3.1.3 Double-Buffered ADC Data Registers
          1. 7.3.1.3.1 ADC Data Format
        4. 7.3.1.4 SCLK Clock Noise Reduction
        5. 7.3.1.5 Data Available Pin (DAV)
        6. 7.3.1.6 Convert Pin (CNVT)
        7. 7.3.1.7 Analog Input Out-of-Range Detection (See The Analog Input Out-of-Range Alarm Section)
        8. 7.3.1.8 Full-Scale Range of the Analog Input
      2. 7.3.2 Secondary ADC and Temperature Sensor Operation
        1. 7.3.2.1 Remote Sensing Diode
        2. 7.3.2.2 Ideality Factor
        3. 7.3.2.3 Filtering
        4. 7.3.2.4 Series Resistance Cancellation
        5. 7.3.2.5 Reading Temperature Data
        6. 7.3.2.6 Conversion Time
      3. 7.3.3 Reference Operation
        1. 7.3.3.1 Internal Reference
        2. 7.3.3.2 External Reference
      4. 7.3.4 DAC Operation
        1. 7.3.4.1 Resistor String
        2. 7.3.4.2 DAC Output
          1. 7.3.4.2.1 Full-Scale Output Range
          2. 7.3.4.2.2 DAC Output After Power-On Reset
        3. 7.3.4.3 Double-Buffered DAC Data Registers
        4. 7.3.4.4 Load DAC Latch
        5. 7.3.4.5 Synchronous Output Updating
        6. 7.3.4.6 Clear DACs
        7. 7.3.4.7 DAC Output Thermal Protection
      5. 7.3.5 Alarm Operation
        1. 7.3.5.1 Analog Input Out-of-Range Alarm
        2. 7.3.5.2 ALARM Pin
        3. 7.3.5.3 Hysteresis
        4. 7.3.5.4 False-Alarm Protection
      6. 7.3.6 General-Purpose Input and Output Pins (GPIO-0 To GPIO-7)
      7. 7.3.7 Device Reset Options
        1. 7.3.7.1 Hardware Reset
        2. 7.3.7.2 Software Reset
        3. 7.3.7.3 Power-On Reset (POR)
    4. 7.4 Device Functional Modes
      1. 7.4.1 DAC Output Mode
      2. 7.4.2 ADC Conversion Modes
        1. 7.4.2.1 Programmable Conversion Rate
        2. 7.4.2.2 Handshaking with the Host (See AFE configuration register 0 )
    5. 7.5 Programming
      1. 7.5.1 I2C-Compatible Interface
        1. 7.5.1.1 F/S-Mode Protocol
        2. 7.5.1.2 Hs-Mode Protocol
        3. 7.5.1.3 Address Pointer
        4. 7.5.1.4 Timeout Function
        5. 7.5.1.5 Device Communication Protocol For I2C
          1. 7.5.1.5.1 Writing A Single Register ( )
          2. 7.5.1.5.2 Writing Multiple Registers ( )
          3. 7.5.1.5.3 Reading a Single Register ( )
          4. 7.5.1.5.4 Reading Multiple Registers ( and )
      2. 7.5.2 Serial Peripheral Interface (SPI)
        1. 7.5.2.1 SPI Shift Register
        2. 7.5.2.2 SPI Communications Command
        3. 7.5.2.3 Standalone Operation
        4. 7.5.2.4 Daisy-Chain Operation
    6. 7.6 Register Maps
      1. 7.6.1  Temperature Data Registers (Read-Only)
        1. 7.6.1.1 LT-Temperature-Data (LT_TEMP) Register (address = 00h) [reset = 0000h, 0°C]
        2. 7.6.1.2 D1-Temperature-Data (D1_TEMP) Register (address = 01h) [reset = 0000h, 0°C]
        3. 7.6.1.3 D2-Temperature-Data (D2_TEMP) Register (address = 02h) [reset = 0000h, 0°C]
      2. 7.6.2  Temperature Configuration (TEMP_CONFIG) Register (address = 0Ah) [reset = 003Ch or 3CFFh]
      3. 7.6.3  Temperature Conversion Rate (TEMP_CONV_RATE) Register (address = 0Bh) [reset = 0007h or 07FFh]
      4. 7.6.4  η-Factor Correction Registers: D1_N_ADJUST and D2_N_ADJUST (address = 21h and 22h) [reset = 0000h or 00FFh]
      5. 7.6.5  ADC-n-Data (ADC_n) Registers (addresses = 23h to 32h) [reset = 0000h]
      6. 7.6.6  DAC-n-Data (DAC_n) Registers (addresses = 33h to 3Eh) [reset = 0000h)
      7. 7.6.7  DAC-n-CLR-Setting (DAC_n_CLR) Registers (addresses = 3Fh to 4Ah) [reset = 0000h]
      8. 7.6.8  GPIO Register (address = 4Bh) [reset = 00FFh]
      9. 7.6.9  AFE Configuration Register 0 (AFE_CONFIG_0) (address = 4Ch) [reset = 2000h]
      10. 7.6.10 AFE Configuration Register 1 (AFE_CONFIG_1) (Address = 4Dh) [reset = 0070h]
      11. 7.6.11 Alarm Control Register (ALR_CTRL) (address = 4Eh) [reset = 0000h]
      12. 7.6.12 STATUS Register (Address = 4Fh) [reset = 0000h]
      13. 7.6.13 ADC Channel Register 0 (ADC_CH0) (address = 50h) [reset = 0000h]
      14. 7.6.14 ADC Channel Register 1 (ADC_CH1) (address = 51h) [reset = 0000h]
      15. 7.6.15 ADC Gain Register (ADC_GAIN) (address = 52h) [reset = FFFFh]
      16. 7.6.16 AUTO_DAC_CLR_SOURCE Register (address = 53h) [reset = 0004h]
      17. 7.6.17 AUTO_DAC_CLR_EN Register (address = 54h) [reset = 0000h]
      18. 7.6.18 SW_DAC_CLR Register (address = 55h) [reset = 0000h]
      19. 7.6.19 HW_DAC_CLR_EN_0 Register (address = 56h) [reset = 0000h]
      20. 7.6.20 HW_DAC_CLR_EN_1 Register (address = 57h) [reset = 0000h]
      21. 7.6.21 DAC Configuration (DAC_CONFIG) Register (address = 58h) [reset = 0000h]
      22. 7.6.22 DAC Gain (DAC_GAIN) Register (address = 59h) [reset = 0000h]
      23. 7.6.23 Analog Input Channel Threshold Registers (addresses = 5Ah To 61h)
        1. 7.6.23.1 Input-n-High-Threshold Register (where n = 0, 1, 2, 3; addresses: 0 = 5Ah, 1 = 5Ch, 2 = 5Eh, 3 = 60h) [reset = 0FFFh]
        2. 7.6.23.2 Input-n-Low-Threshold Register (where n = 0, 1, 2, 3; addresses: 0 = 5Bh, 1 = 5Dh, 2 = 5Fh, 3 = 61h) (reset = 0000h)
      24. 7.6.24 Temperature Threshold Registers
        1. 7.6.24.1 LT_HIGH_THRESHOLD Register (address = 62h) [reset = 07FFh, +255.875°C]
        2. 7.6.24.2 LT_LOW_THRESHOLD Register (address = 63h) [reset = 0800h, –256°C]
        3. 7.6.24.3 D1_HIGH_THRESHOLD Register (address = 64h) [reset = 07FFh, +255.875°C]
        4. 7.6.24.4 D1_LOW_THRESHOLD Register (address = 65h) [reset = 0800h, –256°C]
        5. 7.6.24.5 D2_HIGH_THRESHOLD Register (address = 66h) [reset = 07FFh, +255.875°C]
        6. 7.6.24.6 D2_LOW_THRESHOLD Register (address = 67h) [reset = 0800h, –256°C]
      25. 7.6.25 Hysteresis Registers
        1. 7.6.25.1 Hysteresis Register 0 (HYST_0) (address = 68h) [reset = 0810h, 8 LSB]
        2. 7.6.25.2 Hysteresis Register 1 (HYST_1) (address = 69h) [reset = 0810h, 8 LSB]
        3. 7.6.25.3 Hysteresis Register 2 (HYST_2) (address = 6Ah) [reset = 2108h, 8°C]
      26. 7.6.26 Power-Down Register (PWR_DOWN) (address = 6Bh) [reset = 0000h)
      27. 7.6.27 Device ID Register (DEVICE_ID) (read only address = 6Ch) [reset = 1220h]
      28. 7.6.28 Software Reset (SW_RST) Register (read or write address = 7Ch) [reset = N/A)
        1. 7.6.28.1 SPI Mode
        2. 7.6.28.2 I2C Mode
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Sequencing
        2. 8.2.2.2 Negative GaN Biasing
        3. 8.2.2.3 VDRAIN Monitoring
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Power-Supply Sequence
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Diagram
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.5 Alarm Operation

The device continuously monitors all analog inputs and temperatures in normal operation. When any input is out of the specified range, an alarm triggers. When an alarm state occurs, the corresponding individual alarm bit in the status register is set (1). The global alarm bit (GALR) in AFE configuration register 0 is the OR of individual alarms, see Figure 7-12. When the ALARM-LATCH-DIS bit in the alarm control register is cleared (0), the alarm is latched. The global alarm bit (GALR) maintains 1 until the corresponding error conditions subside and the alarm status is read. The alarm bits are referred to as being latched because these bits remain set until read by software. This design makes sure that out-of-limit events cannot be missed if the software is polling the device periodically. All bits are cleared when reading the status register, and all bits are reasserted if the out-of limit condition still exists on the next monitoring cycle, unless otherwise noted.

GUID-D2F3671C-2151-4266-859D-33FA83141C89-low.gifFigure 7-12 Global Alarm Bit

When the ALARM-LATCH-DIS bit in the alarm control register is set (1), the alarm bit is not latched. The alarm bit in the status register goes to 0 when the error condition subsides, regardless of whether the bit is read or not. When GALR is 1, the ALARM pin goes low. When the GALR bit is 0, the ALARM is high (inactive).