AFE11612-SEP

ACTIVE

Radiation-tolerant, 12-bit analog front end with temperature sensors, 12 DAC and 16 ADC-channels

AFE11612-SEP

ACTIVE

Product details

Number of ADC channels 16 ADC resolution (bps) 12 Number of DAC channels 12 DAC resolution (bps) 12 Temperature sensing Local, Remote Number of GPIOs 8 Interface type I2C, SPI Features GPIO Operating temperature range (°C) -55 to 125 Rating Space ADC sampling rate (ksps) 500 ADC analog input range (min) (V) -5 ADC analog input range (max) (V) 5 DAC settling time (µs) 2 DAC output full-scale (min) (V) 0 DAC output full-scale (max) (V) 12.5
Number of ADC channels 16 ADC resolution (bps) 12 Number of DAC channels 12 DAC resolution (bps) 12 Temperature sensing Local, Remote Number of GPIOs 8 Interface type I2C, SPI Features GPIO Operating temperature range (°C) -55 to 125 Rating Space ADC sampling rate (ksps) 500 ADC analog input range (min) (V) -5 ADC analog input range (max) (V) 5 DAC settling time (µs) 2 DAC output full-scale (min) (V) 0 DAC output full-scale (max) (V) 12.5
HTQFP (PAP) 64 144 mm² (12 mm × 12 mm)
  • Radiation tolerant:
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
    • Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID) V62/22614
    • Military temperature range: –55°C to +125°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • 12 monotonic, 12-bit DACs
    • 0 V to 5 V output range
    • DAC shutdown to user-defined level
  • 16 input, 12-bit SAR ADC
    • High sample rate: 500 kSPS
    • 16 single-ended inputs or 2 differential and 12 single-ended inputs
    • Programmable out-of-range alarms
  • Eight GPIO pins
  • Internal 2.5-V reference
  • Two remote temperature sensors
  • Internal temperature sensor
  • Configurable SPI and I 2C interface
    • 2.7-V to 5.5-V operation
  • Radiation tolerant:
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
    • Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID) V62/22614
    • Military temperature range: –55°C to +125°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • 12 monotonic, 12-bit DACs
    • 0 V to 5 V output range
    • DAC shutdown to user-defined level
  • 16 input, 12-bit SAR ADC
    • High sample rate: 500 kSPS
    • 16 single-ended inputs or 2 differential and 12 single-ended inputs
    • Programmable out-of-range alarms
  • Eight GPIO pins
  • Internal 2.5-V reference
  • Two remote temperature sensors
  • Internal temperature sensor
  • Configurable SPI and I 2C interface
    • 2.7-V to 5.5-V operation

The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.

The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.

The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.

The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.

The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.

The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.

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Technical documentation

Design & development

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Evaluation board

AFE11612EVM — AFE11612-SEP evaluation module for 12-bit analog front end (AFE) with temperature sensors

The AFE11612EVM is an easy-to-use platform that evaluates the functionality and performance of the AFE11612‑SEP device. The AFE11612‑SEP is a highly-integrated, low-power, complete analog monitor and controller that includes a 16-channel (12-bit) analog-to-digital converter (ADC), 12-channel (...)

User guide: PDF | HTML
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GUI for evaluation module (EVM)

AFE11612EVM-GUI — GUI for the AFE11612 evaluation module (EVM)

The AFE11612EVM-GUI is a windows-based software GUI that controls the AFE11612EVM through I2C and SPI.
Supported products & hardware
Simulation tool

AFE11612-SEP-SIM-TOOL — IBIS file for the AFE11612-SEP

IBIS file for the AFE11612-SEP
Supported products & hardware
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HTQFP (PAP) 64 Ultra Librarian

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