SLUSE97 November   2023 BQ76905

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison Table
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Supply Current
    6. 6.6  Digital I/O
    7. 6.7  REGOUT LDO
    8. 6.8  Voltage References
    9. 6.9  Coulomb Counter
    10. 6.10 Coulomb Counter Digital Filter
    11. 6.11 Current Wake Detector
    12. 6.12 Analog-to-Digital Converter
    13. 6.13 Cell Balancing
    14. 6.14 Internal Temperature Sensor
    15. 6.15 Thermistor Measurement
    16. 6.16 Hardware Overtemperature Detector
    17. 6.17 Internal Oscillator
    18. 6.18 Charge and Discharge FET Drivers
    19. 6.19 Comparator-Based Protection Subsystem
    20. 6.20 Timing Requirements—I2C Interface, 100-kHz Mode
    21. 6.21 Timing Requirements—I2C Interface, 400-kHz Mode
    22. 6.22 Timing Diagram
    23. 6.23 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Configuration
      1. 7.3.1 Commands and Subcommands
      2. 7.3.2 Configuration Using OTP or Registers
      3. 7.3.3 Device Security
    4. 7.4 Device Hardware Features
      1. 7.4.1  Voltage ADC
      2. 7.4.2  Coulomb Counter and Digital Filters
      3. 7.4.3  Protection FET Drivers
      4. 7.4.4  Voltage References
      5. 7.4.5  Multiplexer
      6. 7.4.6  LDOs
      7. 7.4.7  Standalone Versus Host Interface
      8. 7.4.8  ALERT Pin Operation
      9. 7.4.9  Low Frequency Oscillator
      10. 7.4.10 I2C Serial Communications Interface
    5. 7.5 Measurement Subsystem
      1. 7.5.1 Voltage Measurement
        1. 7.5.1.1 Voltage ADC Scheduling
        2. 7.5.1.2 Unused VC Pins
        3. 7.5.1.3 General Purpose ADCIN Functionality
      2. 7.5.2 Current Measurement and Charge Integration
      3. 7.5.3 Internal Temperature Measurement
      4. 7.5.4 Thermistor Temperature Measurement
      5. 7.5.5 Factory Trim and Calibration
    6. 7.6 Protection Subsystem
      1. 7.6.1 Protections Overview
      2. 7.6.2 Primary Protections
      3. 7.6.3 CHG Detector
      4. 7.6.4 Cell Open-Wire Protection
      5. 7.6.5 Diagnostic Checks
    7. 7.7 Cell Balancing
    8. 7.8 Device Operational Modes
      1. 7.8.1 Overview of Operational Modes
      2. 7.8.2 NORMAL Mode
      3. 7.8.3 SLEEP Mode
      4. 7.8.4 DEEPSLEEP Mode
      5. 7.8.5 SHUTDOWN Mode
      6. 7.8.6 CONFIG_UPDATE Mode
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Performance Plot
      4. 8.2.4 Random Cell Connection Support
      5. 8.2.5 Startup Timing
      6. 8.2.6 FET Driver Turn-Off
      7. 8.2.7 Usage of Unused Pins
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Coulomb Counter Digital Filter

Typical values stated where TA = 25°C and VBAT = 18.5 V, min/max values stated where TA = –40°C to 110°C and VBAT = 3 V to 27.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
CC1 Charge Integration Digital Filter
t(CC1_CONV) Conversion-time Single conversion 250 ms
B(CC1_RSL) Effective resolution(1)(2) Single conversion, DC inputs from –200 mV to 0 mV across VSRP – VSRN, at 25℃. 15.5 bits
CC2 Current Measurement Digital Filter
t(CM_CONV) Conversion-time in slow mode Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x0 2.93 ms
t(CM_CONV_MEDSLOW) Conversion-time in medium slow mode Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x1 1.46 ms
t(CM_CONV_MEDFAST) Conversion-time in medium fast mode Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x2 732 µs
t(CM_CONV_FAST) Conversion-time in fast mode Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x3 366 µs
B(CM_RES) Effective resolution in slow mode(1)(2) Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x0 15.5 16 bits
B(CM_RES_MEDSLOW) Effective resolution in medium slow mode(1) Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x1 15.7 bits
B(CM_RES_MEDFAST) Effective resolution in medium fast mode(1) Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x2 14.9 bits
B(CM_RES_FAST) Effective resolution in fast mode(1) Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x3 12.9 bits
B(CM_LP_RES) Effective resolution in slow mode and low power mode(1) (2) Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x0, Settings:Configuration:DA Config[CCMODE] = 0x2 15.5 16 bits
B(CM_LP_RES_MEDSLOW) Effective resolution in medium slow mode and low power mode(1) Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x1, Settings:Configuration:DA Config[CCMODE] = 0x2 15.7 bits
B(CM_LP_RES_MEDFAST) Effective resolution in medium fast mode and low power mode(1) Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x2, Settings:Configuration:DA Config[CCMODE] = 0x2 14.9 bits
B(CM_LP_RES_FAST) Effective resolution in fast mode and low power mode(1) Single conversion, in NORMAL mode, Settings:Configuration:Power Config[IADCSPEED] = 0x3, Settings:Configuration:DA Config[CCMODE] = 0x2 12.9 bits
Effective resolution is defined as the resolution such that the data exhibits 1-sigma variation within ±1-LSB.
Specified by characterization