SLVSHA1C September 2024 – August 2025 TPS1685
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
The TPS1685x is an eFuse with integrated power switch that is used to manage load voltage and load current. The device starts the operation by monitoring the VDD and IN bus. When VDD and VIN exceed the respective undervoltage protection (UVP) thresholds, the device waits for the insertion delay timer duration to allow the supply to stabilize before starting up. Next, the device samples the EN/UVLO pin. A high level on this pin enables the internal MOSFET to start conducting and allow current to flow from IN to OUT. When EN/UVLO is held low, the internal MOSFET is turned off.
After a successful start-up sequence, the TPS1685x device now actively monitors the load current and input voltage, and controls the internal FET to verify that the user adjustable overcurrent protection threshold limit ILIM is not exceeded and overvoltage spikes on IN pin are cut-off. This keeps the system safe from harmful levels of voltage and current. At the same time, a user adjustable overcurrent blanking timer allows the system to pass transient peaks in the load current profile without tripping the eFuse. Similarly, voltage transients on the supply line are intelligently masked to prevent nuisance trips. This provides a robust protection solution against real faults which is also immune to transients, thereby providing maximum system uptime.
The device has integrated high accuracy and high bandwidth analog load current monitor, which allows the system to precisely monitor the load current in steady state as well as during transients. This facilitates the implementation of advanced dynamic platform power management techniques to maximize system power utilization and throughput without sacrificing safety and reliability.
For systems needing higher load current support, multiple TPS1685x eFuses can be connected in parallel. All devices share current during start-up as well as steady state to avoid overstressing some of the devices more than others resulting in pre-mature or partial shutdown of the parallel chain. The devices synchronize the operating states to provide graceful startup, shutdown and response to faults.
The device has integrated protection circuits to help provide device safety and reliability under recommended operating conditions. The internal FET is protected at all time using the thermal shutdown mechanism, which turns off the FET whenever the junction temperature (Tj) becomes too hot.