SBAK035 January   2025 ADC168M102R-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased
    4. 2.4 Test Configuration and Condition
  6. 3Total Ionizing Dose (RHA) Characterization Test Results
    1. 3.1 Total Ionizing Dose RHA Characterization Summary Results
  7. 4Applicable and Reference Documents
    1. 4.1 Reference Documents
    2. 4.2 Total Ionizing Dose HDR and LDR Reports

2.2 Test Description and Facilities

The ADC168M102R-SEP HDR exposure was performed on biased devices at TI CLAB facility in Dallas, Texas. The dose rate of the exposure was between 170-260 rad(Si)/s. After the exposure, the devices were electrically tested at TI testing facility. The electrical test guard-band limits were set within the data sheet electrical specifications to maintain a minimum Cpk and test error margin based on initial qualification and characterization data.

The ADC168M102R-SEP LDR exposure was performed on biased devices at Radiation Test Solutions, Inc. in Colorado Springs, CO. The dose rate of the exposure was between 10 mrad(Si)/s. After the exposure, the devices were electrically tested at TI testing facility. The electrical test guard-band limits were set within the data sheet electrical specifications to maintain a minimum Cpk and test error margin based on initial qualification and characterization data.