SBAK035 January   2025 ADC168M102R-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased
    4. 2.4 Test Configuration and Condition
  6. 3Total Ionizing Dose (RHA) Characterization Test Results
    1. 3.1 Total Ionizing Dose RHA Characterization Summary Results
  7. 4Applicable and Reference Documents
    1. 4.1 Reference Documents
    2. 4.2 Total Ionizing Dose HDR and LDR Reports

Total Ionizing Dose HDR and LDR Reports

Pre- and post-TID exposure testing was done with data collected on all critical parameters. All tested parameters were found to be within data sheet specifications during both pre- and post-testing.

Table 4-1 Critical Parameters

Parameter

Units

Lower Limit

Upper Limit

46000001:AVDD_max_supply

mA

5

25

46000003:DVDD_max_supply

mA

1

13

46000004:AVDD_nap_max_supply

uA

0

6200

46000006:DVDD_nap_max_supply

uA

-5

20

46000007:AVDD_pd_max_supply

nA

150000

33000001:offset_A

mV

-2.5

2.5

33000002:gain_A

%

-0.15

0.15

33000004:offset_B

mV

-2.5

2.5

33000005:gain_B

%

-0.15

0.15

33000003:cmrr_A

dB

33000006:cmrr_BdB
43000001:SFDR_AdB

-89

43000002:THD_AdB

-90

43000003:SNR_AdB

89

43000004:SINAD_AdB

88

44000001:SFDR_BdB

-89

44000002:THD_BdB

-90

44000003:SNR_BdB

89

44000004:SINAD_BdB

88

26000002:DNL_max_A

LSB

-2

2

26000004:DNL_min_ALSB

-2

2

26000001:INL_max_ALSB

-4

4

26000003:INL_min_ALSB

-4

4

26000006:DNL_max_BLSB

-2

2

26000008:DNL_min_BLSB

-2

2

26000005:INL_max_BLSB

-4

4

26000007:INL_min_BLSB

-4

4

29000008:internalRef1_FS

V

2.485

2.54

29000011:internalRef2_FS

V

2.485

2.54

53000001:AVDD_3_6V

mA

5

18

53000003:DVDD_3_6V

mA

1

10

53000004:AVDD_nap_3_6V

uA

0

2000