SBASAX3B May   2025  – April 2026 ADS9326 , ADS9327

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Thermal Information
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Electrical Characteristics 
    6. 6.6  Electrical Characteristics: AVDD = 5V
    7. 6.7  Electrical Characteristics: AVDD = 3.3V
    8. 6.8  Timing Requirements
    9. 6.9  Switching Characteristics
    10. 6.10 Timing Diagrams
    11. 6.11 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs
      2. 7.3.2 Reference
        1. 7.3.2.1 Internal Reference
          1. 7.3.2.1.1 Selectable Internal Reference with 5V AVDD
        2. 7.3.2.2 External Reference
        3. 7.3.2.3 External Reference With External Reference Buffer
      3. 7.3.3 Burst Sample Operation
      4. 7.3.4 ADC Transfer Function
      5. 7.3.5 Programmable Data Averaging Filter
        1. 7.3.5.1 Simple Average
          1. 7.3.5.1.1 Simple Average with Noncontinuous CONVST
        2. 7.3.5.2 Moving Average
      6. 7.3.6 Channel Averaging
      7. 7.3.7 Common-Mode Voltage Output
      8. 7.3.8 CRC on Output Data Interface
      9. 7.3.9 ADC Output Data Randomizer
    4. 7.4 Device Functional Modes
      1. 7.4.1 Reset
      2. 7.4.2 Normal Operation
      3. 7.4.3 Low-Latency Mode
      4. 7.4.4 CS-CONVST Short Mode
      5. 7.4.5 Register Read Mode
      6. 7.4.6 Initialization Sequence
    5. 7.5 Programming
      1. 7.5.1  Data Interface
      2. 7.5.2  Data Frame Width
      3. 7.5.3  SPI Modes
      4. 7.5.4  CONVST Inversion
      5. 7.5.5  SCLK Echo Mode
      6. 7.5.6  Daisy-Chain Mode
      7. 7.5.7  SPI Frame Length for Register Operations
      8. 7.5.8  Register Map Lock
      9. 7.5.9  Register Write
      10. 7.5.10 Register Read
  9. Register Map
    1. 8.1 Register Bank 0
    2. 8.2 Register Bank 1
  10. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Analog 1VPP Sine-Cosine Encoder Interface
      2. 9.2.2 Design Requirements
      3. 9.2.3 Detailed Design Procedure
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Mechanical Data

Electrical Characteristics 

at AVDD = 3V to 5.5V, VDD_1V8 = 1.75V to 1.85V, internal reference, and maximum throughput (unless otherwise noted); minimum and maximum values at TA = –40°C to +125°C; typical values at TA = 25°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
DC PERFORMANCE
Resolution No missing codes 16 Bits
DNL Differential nonlinearity –0.75 ±0.2 0.75 LSB
INL Integral nonlinearity –1 ±0.25 1 LSB
V(OS) Input offset error –2 ±0.4 2 LSB
dVOS/dT Input offset error thermal drift 0.6 1.6 µV/°C
Offset error match V(OS) (ADC_A – ADC_B) 1 LSB
GE Gain error(1) –0.02 ±0.002 0.02 %FSR
dGE/dT Gain error thermal drift Reference buffer on(1) 0.8 1.8 ppm/°C
dGE/dT Gain error thermal drift Reference buffer off(2) 0.2 0.6 ppm/°C
Gain error match GE (ADC_A – ADC_B) ±0.002 %FSR
CMRR Common-mode rejection ratio fIN = dc to 1kHz, VINCM = 50mVPP 70 dB
POWER SUPPLY
PSRR Power-supply rejection ratio 100mVpp ripple on AVDD or VDD_1V8 of frequency < 100kHz 80 dB
ANALOG INPUTS
CSH Sampling capacitance 18 pF
BW Analog input bandwidth (large signal) –0.1dB input signal 1.5 MHz
IB Analog input leakage current Idle-channel 0.5 1 µA
COMMON-MODE OUTPUT BUFFER
VCMOUT Common-mode output voltage VREF = 4.096V, VCMOUT_SEL = 0b 2.21 2.23 2.25 V
Output current drive 0 15
μA

INTERNAL REFERENCE
VREF Voltage on REFIO pin (configured as output) 1µF capacitor on REFIO pin, TA = 25°C VREF – 0.005 VREF VREF + 0.005 V
Reference temperature drift 5 15
ppm/°C

DIGITAL INPUTS
VIL Input low logic level 0.3 IOVDD V
VIH Input high logic level 0.7 IOVDD V
DIGITAL OUTPUTS
VOL Output low logic level IOL = 200µA sink 0 0.4 V
VOH Output high logic level IOH = 200µA source IOVDD – 0.4 IOVDD V
SAMPLING DYNAMICS
tA Aperture delay 4 ns
Aperture mismatch 100 ps
tJITTER Aperture jitter 1 ps
These specifications include full temperature range variation but not the error contribution from internal reference.