SLASFB3A November   2023  – July 2025 DAC530A2W , DAC532A3W

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics: Voltage Output
    6. 5.6  Electrical Characteristics: Current Output
    7. 5.7  Electrical Characteristics: Comparator Mode
    8. 5.8  Electrical Characteristics: General
    9. 5.9  Timing Requirements: I2C Standard Mode
    10. 5.10 Timing Requirements: I2C Fast Mode
    11. 5.11 Timing Requirements: I2C Fast-Mode Plus
    12. 5.12 Timing Requirements: SPI Write Operation
    13. 5.13 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 0)
    14. 5.14 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 1)
    15. 5.15 Timing Requirements: GPIO
    16. 5.16 Timing Diagrams
    17. 5.17 Typical Characteristics: Voltage Output
    18. 5.18 Typical Characteristics: Current Output
    19. 5.19 Typical Characteristics: Comparator
    20. 5.20 Typical Characteristics: General
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Smart Digital-to-Analog Converter (DAC) Architecture
      2. 6.3.2 Digital Input/Output
      3. 6.3.3 Nonvolatile Memory (NVM)
    4. 6.4 Device Functional Modes
      1. 6.4.1 Voltage-Output Mode
        1. 6.4.1.1 Voltage Reference and DAC Transfer Function
          1. 6.4.1.1.1 Internal Reference
          2. 6.4.1.1.2 Power-Supply as Reference
      2. 6.4.2 Current-Output Mode
      3. 6.4.3 Comparator Mode
        1. 6.4.3.1 Programmable Hysteresis Comparator
        2. 6.4.3.2 Programmable Window Comparator
      4. 6.4.4 Fault-Dump Mode
      5. 6.4.5 Application-Specific Modes
        1. 6.4.5.1 Voltage Margining and Scaling
          1. 6.4.5.1.1 High-Impedance Output and PROTECT Input
          2. 6.4.5.1.2 Programmable Slew-Rate Control
        2. 6.4.5.2 Function Generation
          1. 6.4.5.2.1 Triangular Waveform Generation
          2. 6.4.5.2.2 Sawtooth Waveform Generation
          3. 6.4.5.2.3 Sine Waveform Generation
      6. 6.4.6 Device Reset and Fault Management
        1. 6.4.6.1 Power-On Reset (POR)
        2. 6.4.6.2 External Reset
        3. 6.4.6.3 Register-Map Lock
        4. 6.4.6.4 NVM Cyclic Redundancy Check (CRC)
          1. 6.4.6.4.1 NVM-CRC-FAIL-USER Bit
          2. 6.4.6.4.2 NVM-CRC-FAIL-INT Bit
      7. 6.4.7 General-Purpose Input/Output (GPIO) Modes
    5. 6.5 Programming
      1. 6.5.1 SPI Programming Mode
      2. 6.5.2 I2C Programming Mode
        1. 6.5.2.1 F/S Mode Protocol
        2. 6.5.2.2 I2C Update Sequence
          1. 6.5.2.2.1 Address Byte
          2. 6.5.2.2.2 Command Byte
        3. 6.5.2.3 I2C Read Sequence
  8. 7 Register Map
    1. 7.1  NOP Register (address = 00h) [reset = 0000h]
    2. 7.2  DAC-0-MARGIN-HIGH Register (address = 0Dh) [reset = 0000h]
    3. 7.3  DAC-1-MARGIN-HIGH Register (address = 13h) [reset = 0000h]
    4. 7.4  DAC-2-MARGIN-HIGH Register (address = 01h) [reset = 0000h]
    5. 7.5  DAC-0-MARGIN-LOW Register (address = 0Eh) [reset = 0000h]
    6. 7.6  DAC-1-MARGIN-LOW Register (address = 14h) [reset = 0000h]
    7. 7.7  DAC-2-MARGIN-LOW Register (address = 02h) [reset = 0000h]
    8. 7.8  DAC-0-GAIN-CONFIG Register (address = 0Fh) [reset = 0000h]
    9. 7.9  DAC-1-GAIN-CMP-CONFIG Register (address = 15h) [reset = 0000h]
    10. 7.10 DAC-2-GAIN-CONFIG Register (address = 03h) [reset = 0000h]
    11. 7.11 DAC-1-CMP-MODE-CONFIG Register (address = 17h) [reset = 0000h]
    12. 7.12 DAC-0-FUNC-CONFIG Register (address = 12h) [reset = 0000h]
    13. 7.13 DAC-1-FUNC-CONFIG Register (address = 18h) [reset = 0000h]
    14. 7.14 DAC-2-FUNC-CONFIG Register (address = 06h) [reset = 0000h]
    15. 7.15 DAC-0-DATA Register (address = 1Bh) [reset = 0000h]
    16. 7.16 DAC-1-DATA Register (address = 1Ch) [reset = 0000h]
    17. 7.17 DAC-2-DATA Register (address = 19h) [reset = 0000h]
    18. 7.18 COMMON-CONFIG Register (address = 1Fh) [reset = 0FFFh]
    19. 7.19 COMMON-TRIGGER Register (address = 20h) [reset = 0000h]
    20. 7.20 COMMON-DAC-TRIG Register (address = 21h) [reset = 0000h]
    21. 7.21 GENERAL-STATUS Register (address = 22h) [reset = 20h, DEVICE-ID, VERSION-ID]
    22. 7.22 CMP-STATUS Register (address = 23h) [reset = 000Ch]
    23. 7.23 GPIO-CONFIG Register (address = 24h) [reset = 0000h]
    24. 7.24 DEVICE-MODE-CONFIG Register (address = 25h) [reset = 0000h]
    25. 7.25 INTERFACE-CONFIG Register (address = 26h) [reset = 0000h]
    26. 7.26 SRAM-CONFIG Register (address = 2Bh) [reset = 0000h]
    27. 7.27 SRAM-DATA Register (address = 2Ch) [reset = 0000h]
    28. 7.28 BRDCAST-DATA Register (address = 50h) [reset = 0000h]
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD Supply voltage, VDD to AGND –0.3 6 V
PVDD Supply voltage, PVDD to VDD –0.3 0.3 V
Digital inputs to AGND –0.3 VDD + 0.3 V
VFB1 to AGND –0.3 VDD + 0.3 V
VOUTX to AGND –0.3 VDD + 0.3 V
IOUT to AGND –0.3 VDD + 0.3 V
Current into any pin except the IOUT, VOUTx, VDD, PVDD, PGND, and AGND pins –10 10 mA
TJ Junction temperature –40 150 °C
Tstg Storage temperature –65 150 °C
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.