over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted), all TYP values are measured at 25℃ and all linearity parameters are measured using 12-bit resolution mode (unless otherwise noted) (1)
| PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
| EI |
Integral linearity error (INL) |
External reference, 12-bit (2) |
-2.5 |
|
+2.5 |
LSB |
| ED |
Differential linearity error (DNL) |
External reference, 12-bit (2) |
-1 |
|
+1.5 |
LSB |
| ED |
Differential linearity error (DNL) |
External reference, 10-bit (2) |
External reference, 10-bit (2) |
-1 |
|
+0.4 |
LSB |
| EO |
Offset error |
External reference, 12-bit (2) |
-5 |
|
5 |
mV |
| EO |
Offset error |
Internal reference, 12-bit |
-5 |
|
5 |
mV |
| EG |
Gain error |
External reference, 12-bit (2) |
-6 |
|
6 |
mV |
(1) Total Unadjusted Error (TUE) can be calculated from EI , EO , and EG using the following formula: TUE = √( EI2 + |EO|2 + EG2 )
Note: You must convert all of the errors into the same unit, usually LSB, for the above equation to be accurate
(2) All external reference specifications are measured with VR+ = VREF+ = VDD = 5V and VR- = VREF- = VSS = 0V and external 1uF cap on VREF+ pin