SLOA059B October   2022  – March 2023 OPA2991 , TLC2654 , TLC4502 , TLE2021 , TLV2721

 

  1.   Abstract
  2.   Trademarks
  3. 1Introduction
  4. 2Input Offset Voltage Defined
  5. 3Cause of VOS
  6. 4VOS and Temperature Drift in the Major Device Types
    1. 4.1 Bipolar
    2. 4.2 JFET
    3. 4.3 CMOS
  7. 5Manufacturer Measurement, Trim, and Specification of VOS
    1. 5.1 Measurement
    2. 5.2 Trim
    3. 5.3 Specifications
  8. 6Impact of VOS on Circuit Design and Methods of Correction
    1. 6.1 AC Coupling
    2. 6.2 DC Feedback
    3. 6.3 Internal Calibration
  9. 7Summary
  10. 8References
  11. 9Revision History

CMOS

CMOS op amps consist of complimentary MOS transistors (NMOS and PMOS together) throughout the device. CMOS devices typically have a low VOS and the lowest drift of all three processes.

The CMOS differential input circuit is the same as that of the bipolar in Figure 3-1, with MOS transistors substituted for Q1 and Q2. The loop equation derived is identical to Equation 13. The MOSFET definition for VGS in Equation 13 is substituted into Equation 13 and manipulated into the form of Equation 14. Here, VOS is primarily due to differences in the threshold voltage, VT (not to be confused with the thermal voltage, VT, of bipolar devices). These are caused by variations in the width, length, thickness, and doping levels of the channels in the transistors (see Gray and Meyer [2]).

Equation 9. V G S = V T + 2 I D k ' · L W
Equation 10. V O S = V T 1 - V T 2 + 2 I D 1 μ C O X · L 1 W 1 - 2 I D 2 μ C O X · L 2 W 2