SLOA059B October   2022  – March 2023 OPA2991 , TLC2654 , TLC4502 , TLE2021 , TLV2721

 

  1.   Abstract
  2.   Trademarks
  3. 1Introduction
  4. 2Input Offset Voltage Defined
  5. 3Cause of VOS
  6. 4VOS and Temperature Drift in the Major Device Types
    1. 4.1 Bipolar
    2. 4.2 JFET
    3. 4.3 CMOS
  7. 5Manufacturer Measurement, Trim, and Specification of VOS
    1. 5.1 Measurement
    2. 5.2 Trim
    3. 5.3 Specifications
  8. 6Impact of VOS on Circuit Design and Methods of Correction
    1. 6.1 AC Coupling
    2. 6.2 DC Feedback
    3. 6.3 Internal Calibration
  9. 7Summary
  10. 8References
  11. 9Revision History

4 VOS and Temperature Drift in the Major Device Types

There are three major manufacturing processes in which most op amps can be grouped: bipolar, JFET, and CMOS. The magnitude of VOS varies, but each process has a range associated with it. Table 6-2 shows the range and drift associated with each process type and lists the typical, max, and full range VOS for various op amps of each type. A brief description of each process and the mechanism of VOS and drift for that particular process are described below. See Gray and Meyer [2] and Dostál [3] for more detail concerning VOS and drift for the processes described in this section.

Table 4-1 Range of Input Offset Voltage and Drift Per Device Process †Typical specifications *Laser trimmed

Note: Devices listed are commercial, ranges valid for all temperature ranges

ProcessDevice TypeYearVOS†at 25 °C (μV)ΔVOS/ΔT† (μV/°C)
BipolarLM2904B20193003.5
LM2902B20223007
TLV600320193902
JFETOPA46220182004
OPA828*2018500.45
CMOSOPA299120191250.3
TLV904120216000.8
OPA231020222500.5
TLV916220212100.25