SLOS198B August   1997  – July 2025 TLV2731

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Pin Configuration and Functions
  6. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 Dissipation Rating Table
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Electrical Characteristics, VDD = 3V
    5. 5.5 Operating Characteristics, VDD = 3V
    6. 5.6 Electrical Characteristics, VDD = 5V
    7. 5.7 Operating Characteristics, VDD = 5V
    8. 5.8 Typical Characteristics
  7. 6Application and Implementation
    1. 6.1 Application Information
      1. 6.1.1 Driving Large Capacitive Loads
  8. 7Device and Documentation Support
    1. 7.1 Receiving Notification of Documentation Updates
    2. 7.2 Support Resources
    3. 7.3 Trademarks
    4. 7.4 Electrostatic Discharge Caution
    5. 7.5 Glossary
  9. 8Revision History
  10. 9Mechanical, Packaging, and Orderable Information

8 Revision History

Changes from Revision A (March 2001) to Revision B (July 2025)

  • Updated the numbering format for tables, figures, and cross-references throughout the documentGo
  • Added Applications, Pin Configuration and Functions, Specifications, Application and Implementation, Device and Documentation Support, and Mechanical, Packaging, and Orderable Information sectionsGo
  • Deleted TLV273Y device and associated content from data sheetGo
  • Deleted "Macromodel Included" from Features Go
  • Added Applications sectionGo
  • Deleted TLV2731Y chip informationGo
  • Deleted equivalent schematicGo
  • Updated formatting based on the latest standardsGo
  • Deleted input offset voltage long-term drift and associated table note 4Go
  • Deleted common-mode input voltage range typical valueGo
  • Deleted common-mode input voltage range for full temperature rangeGo
  • Changed differential input resistance typical value from 1012Ω to 540GΩGo
  • Changed common-mode input resistance unit typical value from 1012Ω to 1TΩGo
  • Changed common-mode input capacitance typical value from 6pF to 1pFGo
  • Changed output impedance from closed-loop to open-loopGo
  • Changed open-loop output impedance test condition from AV = 1 to IO = 0AGo
  • Changed output impedance typical value from 156Ω to 525ΩGo
  • Changed CMRR minimum value for room temperature from 60dB to 54dBGo
  • Changed CMRR minimum value for full temperature range from 55dB to 54dBGo
  • Added table note 2 to input bias current and input offset currentGo
  • Changed slew rate typical value for room temperature from 1.25V/μs to 0.25V/μsGo
  • Changed slew rate minimum value for room temperature from 0.75V/μs to 0.24V/μsGo
  • Changed slew rate minimum value for full temperature range from 0.5V/μs to 0.24V/μsGo
  • Deleted equivalent input noise voltage for f = 10HzGo
  • Deleted peak-to-peak equivalent input noise voltage for f = 0.1Hz to 1HzGo
  • Changed peak-to-peak equivalent input noise voltage for f = 0.1Hz to 10Hz from 1.5μV to 1.8μVGo
  • Changed equivalent input noise current typical value from 0.6fA/√Hz to 2fA/√Hz Go
  • Deleted THD+N test conditions and changed values to "see Typical Characteristics"Go
  • Deleted settling timeGo
  • Deleted gain marginGo
  • Deleted input offset voltage long-term drift and associated table note 4Go
  • Deleted common-mode input voltage range typical valueGo
  • Deleted common-mode input voltage range for full temperature rangeGo
  • Changed differential input resistance typical value from 1012Ω to 540GΩGo
  • Changed common-mode input resistance from 1012Ω to 1TΩGo
  • Changed common-mode input capacitance from 6pF to 1pFGo
  • Changed output impedance from closed-loop to open-loopGo
  • Changed output impedance test condition from AV = 1 to IO = 0AGo
  • Changed output impedance typical value from 138Ω to 525ΩGo
  • Added table note to input bias current and input offset currentGo
  • Deleted equivalent input noise voltage for f = 10HzGo
  • Deleted peak-to-peak equivalent input noise voltage for f = 0.1Hz to 1HzGo
  • Changed peak-to-peak equivalent input noise voltage for f = 0.1Hz to 10Hz from 1.5μV to 1.8μVGo
  • Changed equivalent input noise current typical value from 0.6fA/√Hz to 2fA/√Hz Go
  • Deleted THD+N test conditions and changed values to "see Typical Characteristics"Go
  • Deleted settling timeGo
  • Deleted gain marginGo
  • Deleted Figures 8, 9, 11, 15, 16, 18–20, 23–26, 33, 34, 47–54, Go
  • Updated Figure 5-31, 5-32, and 5-33Go
  • Updated Driving Large Capacitive Loads sectionGo
  • Deleted Macromodel Information Go