SLVK075A May   2022  – April 2025 DP83561-SP

 

  1.   1
  2.   Single-Event Effects Test Report of the DP83561-SP Space grade (QMLV-RHA) 10/100/1000 Ethernet PHY
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
    1.     7
  7. 4Irradiation Facility and Setup
  8. 5Depth, Range, and LETEFF Calculation
  9. 6Test Setup and Procedures
  10. 7Single Event Effects (SEE)
    1. 7.1 Single-Event-Latchup (SEL)
    2. 7.2 Single Event Transients (SET)
  11. 8Summary
  12.   A References
  13.   B Revision History

Abstract

The purpose of this study is to characterize the single-event-effect (SEE) performance due to heavy-ion irradiation of the DP83561-SP. Heavy-ions with LETEFF ranging from 8 to 121 MeV × cm2/ mg were used to irradiate production RHA devices in the experiments with fluences up to 106. The results demonstrated that the DP83561-SP is SEL-free up to 121 MeV × cm2/ mg at T = 125°C. The SET cross section and BER calculations are presented across different LETs.