SLVK075A May   2022  – April 2025 DP83561-SP

 

  1.   1
  2.   Single-Event Effects Test Report of the DP83561-SP Space grade (QMLV-RHA) 10/100/1000 Ethernet PHY
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
    1.     7
  7. 4Irradiation Facility and Setup
  8. 5Depth, Range, and LETEFF Calculation
  9. 6Test Setup and Procedures
  10. 7Single Event Effects (SEE)
    1. 7.1 Single-Event-Latchup (SEL)
    2. 7.2 Single Event Transients (SET)
  11. 8Summary
  12.   A References
  13.   B Revision History

4 Irradiation Facility and Setup

The heavy-ion species used for the SEE studies on this product were provided and delivered by the TAMU Cyclotron Radiation Effects Facility [6] using a superconducting cyclotron and an advanced electron cyclotron resonance (ECR) ion source. At the fluxes used, ion beams had good flux stability and high irradiation uniformity over a one inch diameter circular cross sectional area for the in-air station. Uniformity is achieved by magnetic defocusing. The flux of the beam is regulated over a broad range spanning several orders of magnitude. For the bulk of these studies, ion flux of 104 and 105 ions/cm2·s were used to provide heavy-ion fluences of 106 and 107 ions/cm 2.

For the experiments conducted on this report, 40Ar ions at angle of 39.4° of incidence were used for an LETEFF of 8MeV × cm2/ mg, 197Au ions at angles of 0° and of incidence were used for an LETEFF of 85 and 95MeV·cm2/mg. Also, 197Au ions at angles of 29° and 43° of incidence were used for an LETEFF of 100 and 121MeV × cm2/mg, respectively. 131Xe at angles of 0° and 39.4° of incidence were used for an LETEFF of 48 and 78MeV × cm2/mg, respectively.

Figure 4-1 shows the DP83561-SP test board used for the experiments at the TAMU facility. Although not visible in this photo, the beam port has a 1mil Aramica window to allow in-air testing while maintaining the vacuum within the accelerator with only minor ion energy loss. Test points were soldered on the back for easy access of the signals while having enough room to change the angle of incidence and maintaining the 40mm distance to the die. The air gap between the device and the ion beam port window was maintained at 40mm for all runs.

DP83561-SP Photograph of the DP83561-SP Mounted on the DP83561EVM in Front of the Heavy Ion Beam Exit Port at the TAMU Accelerator Facility Figure 4-1 Photograph of the DP83561-SP Mounted on the DP83561EVM in Front of the Heavy Ion Beam Exit Port at the TAMU Accelerator Facility

A Spirent Smartbits SMB-200 packet generator was used to generate Ethernet packets to the DP83561-SP on the DP83561EVM. The DP83561EVM was configured for external RGMII loopback, using an external breakout board to short the MAC receive pins to the MAC transmit pins of the DP83561-SP device. Packets were returned through the PHY back to the Smartbits packet generator, where total number of packets sent, packets received, and CRC errors were counted. Additional signals, link status and RX_CLK, were monitored as well.

DP83561-SP DP83561-SP Radiation Test Setup Block Diagram Figure 4-2 DP83561-SP Radiation Test Setup Block Diagram