SLVK075A May   2022  – April 2025 DP83561-SP

 

  1.   1
  2.   Single-Event Effects Test Report of the DP83561-SP Space grade (QMLV-RHA) 10/100/1000 Ethernet PHY
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
    1.     7
  7. 4Irradiation Facility and Setup
  8. 5Depth, Range, and LETEFF Calculation
  9. 6Test Setup and Procedures
  10. 7Single Event Effects (SEE)
    1. 7.1 Single-Event-Latchup (SEL)
    2. 7.2 Single Event Transients (SET)
  11. 8Summary
  12.   A References
  13.   B Revision History

A References

  1. M. Shoga and D. Binder, “Theory of Single Event Latchup in Complementary Metal-Oxide Semiconductor Integrated Circuits”, IEEE Trans. Nucl. Sci, Vol. 33(6), Dec. 1986, pp. 1714-1717.
  2. G. Bruguier and J.M. Palau, “Single particle-induced latchup”, IEEE Trans. Nucl. Sci, Vol. 43(2), Mar. 1996, pp. 522-532.
  3. G. H. Johnson, J. H. Hohl, R. D. Schrimpf and K. F. Galloway, "Simulating single-event burnout of n-channel power MOSFET's," in IEEE Transactions on Electron Devices, vol. 40, no. 5, pp. 1001-1008, May 1993.
  4. J. R. Brews, M. Allenspach, R. D. Schrimpf, K. F. Galloway, J. L. Titus and C. F. Wheatley, "A conceptual model of a single-event gate-rupture in power MOSFETs," in IEEE Transactions on Nuclear Science, vol. 40, no. 6, pp. 1959-1966, Dec. 1993.
  5. G. H. Johnson, R. D. Schrimpf, K. F. Galloway, and R. Koga, “Temperature dependence of singleevent burnout in n-channel power MOSFETs [for space application],” IEEE Trans. Nucl. Sci., 39(6), Dec. 1992, pp. 1605-1612.
  6. Texas A&M University, TAMU Radiation Effects Facility, webpage.
  7. “The Stopping and Range of Ions in Matter” (SRIM) software simulation tools website. http://www.srim.org/index.htm#SRIMMENU
  8. Vanderbilt University, CRÈME-MC, webpage.
  9. A. J. Tylka, et al., "CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code", IEEE Trans. Nucl. Sci., 44(6), 1997, pp. 2150-2160.
  10. A. J. Tylka, W. F. Dietrich, and P. R. Bobery, “Probability distributions of high-energy solar-heavy-ion fluxes from IMP-8: 1973-1996”, IEEE Trans. on Nucl. Sci., 44(6), Dec. 1997, pp. 2140 – 2149.
  11. A. J. Tylka, J. H. Adams, P. R. Boberg, et al.,“CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code”, Trans. on Nucl. Sci, 44(6), Dec. 1997, pp. 2150 – 2160.
  12. D. Kececioglu, “Reliability and Life Testing Handbook”, Vol. 1, PTR Prentice Hall, New Jersey,1993, pp. 186-193.