SLVK075A May 2022 – April 2025 DP83561-SP
SEE testing was performed on a DP83561-SP device mounted on a DP83561EVM. The device power was provided by using terminal block J17. For the SEL and SET testing, the device was powered up to the maximum recommended supply voltages for each supply. Ambient temperature was measured to be 125 degrees Celsius, monitored using thermocouple on the board for both 1000Mbps, and 100Mbps configuration.
Supply currents were dynamically monitored throughout all tests. No incidences of SEL were detected on any ion runs. A single high current was observed during the 100Mbps SEL testing. However, this current value can be attributed to the PHY re-setting to a Gigabit speed when experiencing the high flux and fluence rate. The Gigabit speed setting was confirmed by monitoring the RX_CLK frequency, and the high current observed did not exceed the expected current for Gigabit communication. Link status, and packet transmission were also dynamically monitored through GPIOs and the Smartbits.
All boards used for SEE testing were fully checked for functionality. Dry runs were also performed to verify that the test system was stable under all bias and load conditions prior to being taken to the TAMU facility. During the heavy-ion testing, the LabView control program powered up the DP83561-SP device and set the external sourcing and monitoring functions of the external equipment. After functionality and stability had been confirmed, the beam shutter was opened to expose the device to the heavy-ion beam. The shutter remained open until the target fluence was achieved (determined by external detectors and counters). During irradiation, the PXIe-5101 scope cards continuously monitored the signals. When the output voltage exceeds the pre-defined 3% window trigger, or when the PG signal changed from High to Low (using a negative edge trigger), a data capture was initiated on the scope cards. 20k samples were recorded with a pre-defined 20% reference. No sudden increases in current were observed (outside of normal fluctuations) on any of the test runs indicated that no SEL events occurred during any of the tests.