SLVK075A May   2022  – April 2025 DP83561-SP

 

  1.   1
  2.   Single-Event Effects Test Report of the DP83561-SP Space grade (QMLV-RHA) 10/100/1000 Ethernet PHY
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
    1.     7
  7. 4Irradiation Facility and Setup
  8. 5Depth, Range, and LETEFF Calculation
  9. 6Test Setup and Procedures
  10. 7Single Event Effects (SEE)
    1. 7.1 Single-Event-Latchup (SEL)
    2. 7.2 Single Event Transients (SET)
  11. 8Summary
  12.   A References
  13.   B Revision History

8 Summary

The purpose of this report is to summarize the DP83561-SP SEE performance under heavy-ions irradiation. The data shows the device is SEL free up to 121 MeV. Weibull fit was created when applicable and LEO (ISS) and GEO orbit rate calculations were calculated and presented. The worst case on orbit rate MTBE (mean-time between events) is shown to be on the order of 104 years.