SLVSI26 July 2026 TPS1HC03-Q1
PRODMIX
When switching an inductive load off, the inductive reactance tends to pull the output voltage negative. Excessive negative voltage can cause the power FET to break down. To protect the power FET, implement an internal clamp between drain and source, namely VDS(clamp).
During the period of demagnetization (tdecay), the power FET turns on for inductance-energy dissipation. The total energy dissipates in the high-side switch. Total energy includes the energy of the power supply (E(VS)) and the energy of the load (E(load)). If resistance is in series with inductance, some of the load energy dissipates on the resistance.
When an inductive load switches off, E(HSS) causes high thermal stressing on the device. The upper limit of the power dissipation depends on the device intrinsic capacity, ambient temperature, and board dissipation condition.
Figure 8-23 Drain-to-Source Clamping Structure
Figure 8-24 Inductive Load Switching-Off DiagramFrom the perspective of the high-side switch, E(HSS) equals the integration value during the demagnetization period.
When R approximately equals 0, E(HSD) is:
Note that for PWM-controlled inductive loads, adding the external freewheeling circuitry as shown in the figure below, is recommended to protect the device from repetitive power stressing. TVS is used to achieve the fast decay.
Figure 8-25 Protection with External
CircuitryThe figure below shows the VDS clamp engaging during 5mH inductive load discharge.
The following figures show maximum energy dissipation capability of the device during inductive load turn off.