SLVSJZ0 October 2025 MCF8316D-Q1
PRODUCTION DATA
MCF8316D-Q1 provides an EEPROM fault detection feature to prevent device operation when there is EEPROM data mismatch due to an interrupted EEPROM write (UVLO during EEPROM write), EEPROM aging etc., MCF8316D-Q1 implements a CRC and parity check whenever an EEPROM read command is issued - if there is a CRC or parity mismatch, an EEPROM fault is recognized and action taken according to EEP_FAULT_MODE. If EEP_FAULT_MODE is set to 0b, nFAULT is pulled low, the FETs are in Hi-Z and the CONTROLLER_FAULT and EEPROM_ERR_STATUS bits are set to 1b until the fault condition is cleared by writing 1b to CLR_FLT. If EEP_FAULT_MODE is set to 1b, this fault is reported on nFAULT pin and CONTROLLER_FAULT, EEPROM_ERR_STATUS bits are set to 1b but the device operation (FETs) continues normally. The fault reporting can be cleared (nFAULT pin is released, CONTROLLER_FAULT, EEPROM_ERR_STATUS set to 0b) by writing 1b to CLR_FLT.