SLVSLM8 May   2026 BQ78709-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information BQ78709-Q1
    5. 6.5  Supply Current
    6. 6.6  Digital I/O
    7. 6.7  REGOUT LDO
    8. 6.8  Voltage References
    9. 6.9  Coulomb Counter
    10. 6.10 Coulomb Counter Digital Filter
    11. 6.11 Current Wake Detector
    12. 6.12 Analog-to-Digital Converter
    13. 6.13 Cell Voltage Measurement Accuracy
    14. 6.14 Cell Balancing
    15. 6.15 Internal Temperature Sensor
    16. 6.16 Thermistor Measurement
    17. 6.17 Hardware Overtemperature Detector
    18. 6.18 Internal Oscillator
    19. 6.19 Charge and Discharge FET Drivers
    20. 6.20 Comparator-Based Protection Subsystem
    21. 6.21 Timing Requirements - I2C Interface, 100kHz Mode
    22. 6.22 Timing Requirements - I2C Interface, 400kHz Mode
    23. 6.23 Timing Diagram
    24. 6.24 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Configuration
      1. 7.3.1 Commands and Subcommands
      2. 7.3.2 Configuration Using OTP or Registers
      3. 7.3.3 Device Security
    4. 7.4 Device Hardware Features
      1. 7.4.1  Voltage ADC
      2. 7.4.2  Coulomb Counter and Digital Filters
      3. 7.4.3  Protection FET Drivers
      4. 7.4.4  Voltage References
      5. 7.4.5  Multiplexer
      6. 7.4.6  LDOs
      7. 7.4.7  Standalone Versus Host Interface
      8. 7.4.8  ALERT Pin Operation
      9. 7.4.9  Low Frequency Oscillator
      10. 7.4.10 I2C Serial Communications Interface
    5. 7.5 Measurement Subsystem
      1. 7.5.1 Voltage Measurement
        1. 7.5.1.1 Voltage ADC Scheduling
        2. 7.5.1.2 Unused VC Pins
        3. 7.5.1.3 General Purpose ADCIN Functionality
      2. 7.5.2 Current Measurement and Charge Integration
      3. 7.5.3 Internal Temperature Measurement
      4. 7.5.4 Thermistor Temperature Measurement
      5. 7.5.5 Factory Trim and Calibration
    6. 7.6 Protection Subsystem
      1. 7.6.1 Protections Overview
      2. 7.6.2 Primary Protections
      3. 7.6.3 CHG Detector
      4. 7.6.4 Cell Open-Wire Protection
      5. 7.6.5 Diagnostic Checks
    7. 7.7 Cell Balancing
    8. 7.8 Device Operational Modes
      1. 7.8.1 Overview of Operational Modes
      2. 7.8.2 NORMAL Mode
      3. 7.8.3 SLEEP Mode
      4. 7.8.4 DEEPSLEEP Mode
      5. 7.8.5 SHUTDOWN Mode
      6. 7.8.6 CONFIG_UPDATE Mode
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Performance Plot
      4. 8.2.4 Random Cell Connection Support
      5. 8.2.5 Startup Timing
      6. 8.2.6 FET Driver Turn-Off
      7. 8.2.7 Usage of Unused Pins
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
DESCRIPTIONPINSMINMAXUNIT
Supply voltage range, VIN(DC)(2)BAT, REGSRCVSS–0.3VSS+40V
Short duration input voltage range, VIN(short)(2)VC1 - VC7, BAT, REGSRC, CHGVSS+45V
DC input voltage range, VIN(DC)ALERT, SCL, SDAVSS–0.3VSS+6V
DC input voltage range, VIN(DC)TSVSS–0.32.1V
DC input voltage range, VIN(DC)(2)SRP, SRNVSS–0.32.1V
DC input voltage range, VIN(DC)(2)VC7Maximum of VSS–0.3 and VC6–0.3VSS+40V
DC input voltage range, VIN(DC)(2)VC6Maximum of VSS–0.3 and VC5–0.3VSS+40V
DC input voltage range, VIN(DC)(2)VC5Maximum of VSS–0.3 and VC4–0.3VSS+40V
DC input voltage range, VIN(DC)(2)VC4Maximum of VSS–0.3 and VC3–0.3VSS+40V
DC input voltage range, VIN(DC)(2)VC3Maximum of VSS–0.3 and VC2–0.3VSS+40V
DC input voltage range, VIN(DC)(2)VC2Maximum of VSS–0.3 and VC1–0.3VSS+40V
DC input voltage range, VIN(DC)(2)VC1Maximum of VSS–0.3 and VC0–0.3VSS+40V
DC input voltage range, VIN(DC)VC0VSS–0.3VSS+6V
DC input voltage range, VIN(DC)(2)CHGVSS–30VSS+40V
Output voltage range, VODSGVSS–0.3VSS+20V
Output voltage range, VOREGOUTVSS–0.3VSS+6V
Maximum cell balancing current, each cellVC0 – VC750mA
Junction temperature, TJ–65150°C
Storage temperature, TSTG–65150°C
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(2) Stresses applied above VIN(DC) and below VIN(SHORT) must be limited to less than 100 hours over the lifetime of the device.  These stresses may occur during brief transient events but DC voltages in this range should not be applied.