SPRZ457H January   2021  – December 2023 AM2431 , AM2432 , AM2434 , AM6411 , AM6412 , AM6421 , AM6422 , AM6441 , AM6442

 

  1.   1
  2. 1Usage Notes and Advisories Matrices
    1. 1.1 Devices Supported
  3. 2Silicon Usage Notes and Advisories
    1. 2.1 Silicon Usage Notes
      1.      i2287
      2.      i2351
    2. 2.2 Silicon Advisories
      1.      i2049
      2.      i2062
      3.      i2103
      4.      i2184
      5.      i2189
      6.      i2236
      7.      i2185
      8.      i2196
      9.      i2207
      10.      i2208
      11.      i2228
      12.      i2232
      13.      i2244
      14.      i2245
      15.      i2091
      16.      i2235
      17.      i2303
      18.      i2317
      19.      i2134
      20.      i2257
      21.      i2277
      22.      i2285
      23.      i2310
      24.      i2311
      25.      i2313
      26.      i2328
      27.      i2241
      28.      i2279
      29.      i2307
      30.      i2320
      31.      i2329
      32.      i2331
      33.      i2243
      34.      i2249
      35.      i2256
      36.      i2274
      37.      i2278
      38.      i2306
      39.      i2363
      40.      i2312
      41.      i2371
      42.      i2366
      43.      i2138
      44.      i2253
      45.      i2259
      46.      i2283
      47.      i2305
      48.      i2326
      49.      i2368
      50.      i2383
      51.      i2401
      52.      i2409
  4.   Trademarks
  5.   Revision History

i2277

POK: De-Glitch (filter) is based upon only two samples

Details

The POK is sampled on an approximate period of 1.25us. The "near-by" sample history is saved in a circular buffer. The De-Glitch (filter) is designed to AND the last n entries from the sample history in order to generate the output (to the ESM).

The De-Glitch filter is programmable to {4, 8, 12, 16} samples. The De-Glitch output is based upon a check of only the last entry (0th) and programmed number of samples ago (i.e. 3rd, 7th, 11th, or 15th). The filter ANDs these two results (instead of 4, 8, 12, or 16) in order to to generate the FAIL output to the ESM.

Notice that when the POK is set to monitor a fixed threshold (UV or OV but not set to ping-pong), the un-checked samples will be used.

When the POKs are controlled in a ping-pong manner, the skipped samples will be discarded.

Workaround

There is no workaround.

However, the intent of the De-Glitch (filtering) is to insure that a discrete voltage dip or rise does not trigger FAIL. The sampling of two points significantly separated in time means that the voltage dip / rise was not a single isolated event.

Since the filter requires all N samples to fail before generating a FAIL signal to the ESM, the inclusion of 2 points instead of N makes this circuit more sensitive.