TIDUDA6A December   2017  – January 2022

 

  1.   Description
  2.   Resources
  3.   Features
  4.   Applications
  5.   5
  6. 1 System Description
    1. 1.1 Key System Specifications
  7. 2 System Overview
    1. 2.1 Block Diagram
    2. 2.2 System-Level Description
    3. 2.3 Highlighted Products
      1. 2.3.1 Analog Signal Chain
        1. 2.3.1.1 LMH5401
        2. 2.3.1.2 LHM6401
        3. 2.3.1.3 BUF802
      2. 2.3.2 Clock
        1. 2.3.2.1 LMK61E2
        2. 2.3.2.2 LMK04828
        3. 2.3.2.3 LMX2594
      3. 2.3.3 Power
        1. 2.3.3.1 TPS82130
        2. 2.3.3.2 TPS7A84
    4. 2.4 System Design Theory
      1. 2.4.1 High-Speed, Low-Phase Noise Clock Generation
      2. 2.4.2 Channel-to-Channel Skew
      3. 2.4.3 Deterministic Latency
        1. 2.4.3.1 Importance of Deterministic Latency
      4. 2.4.4 Analog Front End
      5. 2.4.5 Multichannel System Power Requirement
      6. 2.4.6 Hardware Programming
  8. 3 Circuit Design
    1. 3.1 Analog Input Front End
      1. 3.1.1 High-Input Impedance Buffer Implementation Using the BUF802
    2. 3.2 High-Speed Multichannel Clocking
    3. 3.3 Power Supply Section
      1. 3.3.1 DC-DC
        1. 3.3.1.1 How to Set 2.1-V Output Voltage
      2. 3.3.2 LDOs
  9. 4 Host Interface
  10. 5 Hardware Functional Block
  11. 6 Getting Started Application GUI
  12. 7 Testing and Results
    1. 7.1 Test Setup and Test Plan
    2.     44
    3. 7.2 SNR Measurement Test
    4. 7.3 Channel-to-Channel Skew Measurement Test
    5. 7.4 Performance Test Result
    6. 7.5 Multichannel Skew Measurement
    7. 7.6 49
  13. 8 Design Files
    1. 8.1 Schematics
    2. 8.2 Bill of Materials
    3. 8.3 Altium Project
    4. 8.4 Gerber Files
    5. 8.5 Assembly Drawings
  14. 9 Software Files
  15. 10Related Documentation
    1. 10.1 Trademarks
  16. 11About the Authors
    1. 11.1 Acknowledgment
  17. 12Revision History

7.1 Test Setup and Test Plan

Figure 7-1, Figure 7-2, and Figure 7-3 show the test setup for performing signal chain SNR measurements for the transformer input, the LMH inputs, and the channel-to-channel clock skew, respectively.

GUID-19F27C56-EA8C-4E4B-91BF-EB991BDC145C-low.gifFigure 7-1 Test Setup for SNR Measurement (Transformer Input)
GUID-1DE87DDB-A506-4D5E-90E3-27306AE8E30C-low.gifFigure 7-2 Test Setup for SNR Measurement (LMH6501+LMH5401 Input Path)
GUID-176A517B-368B-462D-BB42-23CBD5B57005-low.gifFigure 7-3 Test Setup for Channel-to-Channel Skew Measurement