TIDUFE3 July   2025

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1System Description
    1. 1.1 Key System Specifications
  8. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
    3. 2.3 Highlighted Products
      1. 2.3.1 TPS7A03
      2. 2.3.2 REF35
      3. 2.3.3 TVS3301
      4. 2.3.4 OPA391
      5. 2.3.5 AFE881H1
      6. 2.3.6 AFE882H1
      7. 2.3.7 SN74LV8T165
      8. 2.3.8 TMUX1219
  9. 3System Design Theory
  10. 4Hardware, Software, Testing Requirements, and Test Results
    1. 4.1 Hardware Requirements
    2. 4.2 Test Setup
    3. 4.3 Test Results
      1. 4.3.1 Linearity Tests
        1. 4.3.1.1 Linearity Tests Summary
      2. 4.3.2 Noise Tests and Current Histogram
        1. 4.3.2.1 Noise Tests and Current Histogram Summary
      3. 4.3.3 Step Response
        1. 4.3.3.1 Step Response Summary
      4. 4.3.4 Start-Up
      5. 4.3.5 MCU Current
        1. 4.3.5.1 MCU Current Summary
      6. 4.3.6 System Currents
        1. 4.3.6.1 Summary of System Currents
  11. 5Design and Documentation Support
    1. 5.1 Design Files
      1. 5.1.1 Schematics
      2. 5.1.2 BOM
      3. 5.1.3 PCB Layout Recommendations
        1. 5.1.3.1 Layout Prints
    2. 5.2 Tools and Software
    3. 5.3 Documentation Support
    4. 5.4 Support Resources
    5. 5.5 Trademarks
  12. 6About the Author

4.2 Test Setup

For all tests, the reference design is combined with a ADS122S14 EVM which contains an ADC as well as an MCU controlling the AFE as well as the ADC. The different test setups are explained in the next section.