Radiation-tolerant, -3-V to -16.5-V input, 1-A, negative linear regulator in space-enhanced plastic

TPS7H1210-SEP

ACTIVE

Product details

Output options Adjustable Output, Negative Output Iout (Max) (A) 1 Vin (Max) (V) -3 Vin (Min) (V) -16.5 Vout (Max) (V) -1.2 Vout (Min) (V) -15.5 Noise (uVrms) 13.7 Iq (Typ) (mA) 0.21 Thermal resistance θJA (°C/W) 32.7 Rating Space Load capacitance (Min) (µF) 10 Regulated outputs (#) 1 Features Enable, Soft Start Accuracy (%) 2 PSRR @ 100 KHz (dB) 61 Dropout voltage (Vdo) (Typ) (mV) 363 Operating temperature range (C) -55 to 125 Radiation, SEL (MeV.cm2/mg) 43 Radiation, TID (Typ) (krad) 30
Output options Adjustable Output, Negative Output Iout (Max) (A) 1 Vin (Max) (V) -3 Vin (Min) (V) -16.5 Vout (Max) (V) -1.2 Vout (Min) (V) -15.5 Noise (uVrms) 13.7 Iq (Typ) (mA) 0.21 Thermal resistance θJA (°C/W) 32.7 Rating Space Load capacitance (Min) (µF) 10 Regulated outputs (#) 1 Features Enable, Soft Start Accuracy (%) 2 PSRR @ 100 KHz (dB) 61 Dropout voltage (Vdo) (Typ) (mV) 363 Operating temperature range (C) -55 to 125 Radiation, SEL (MeV.cm2/mg) 43 Radiation, TID (Typ) (krad) 30
VQFN (RGW) 20 25 mm² 5 x 5
  • Vendor item drawing available, VID V62/21616
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • TID RLAT (radiation lot acceptance testing) for every wafer lot to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 43 MeV-cm2/mg
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized to LET = 43 MeV-cm2/mg
  • Low noise: 13.7-µVRMS typical (10 Hz to 100 kHz)
  • High power-supply rejection ration, PSRR (typical at VIN = –6 V, VOUT = –5 V, IOUT = 1 A):
    • 61 dB at 100 Hz
    • 61 dB at 100 kHz
    • 41 dB at 1 MHz
  • Input voltage range: –3 V to –16.5 V
  • Adjustable output: –1.2 V to –15.5 V
  • Up to 1-A output current
  • Stable with ceramic capacitors ≥ 10 µF
  • Built-in current-limit and thermal shutdown protection
  • Space Enhanced Plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Extended product-change notification (PCN)
    • Product traceability
    • Enhanced mold compound for low outgassing
  • Vendor item drawing available, VID V62/21616
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • TID RLAT (radiation lot acceptance testing) for every wafer lot to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 43 MeV-cm2/mg
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized to LET = 43 MeV-cm2/mg
  • Low noise: 13.7-µVRMS typical (10 Hz to 100 kHz)
  • High power-supply rejection ration, PSRR (typical at VIN = –6 V, VOUT = –5 V, IOUT = 1 A):
    • 61 dB at 100 Hz
    • 61 dB at 100 kHz
    • 41 dB at 1 MHz
  • Input voltage range: –3 V to –16.5 V
  • Adjustable output: –1.2 V to –15.5 V
  • Up to 1-A output current
  • Stable with ceramic capacitors ≥ 10 µF
  • Built-in current-limit and thermal shutdown protection
  • Space Enhanced Plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Extended product-change notification (PCN)
    • Product traceability
    • Enhanced mold compound for low outgassing

The TPS7H1210-SEP negative voltage linear regulator is a low noise, high PSRR regulator capable of sourcing a maximum load of 1 A.

The regulator include a CMOS logic-level-compatible enable pin (EN) to allow for user-customizable power management schemes. Other features include built-in current limit and thermal shutdown to protect the device and system during fault conditions.

The TPS7H1210-SEP device is designed using bipolar technology primarily for high-accuracy, low-noise applications, where clean voltage rails are critical to maximize system performance. Therefore, it ideal to power op amps, ADCs, DACs, and other high-performance analog circuitry.

Additionally, the TPS7H1210-SEP device is suitable for post DC-DC converter regulation. By filtering the output voltage ripple inherent to DC-DC switching conversion, maximum system performance is ensured in sensitive devices and RF applications.

The TPS7H1210-SEP negative voltage linear regulator is a low noise, high PSRR regulator capable of sourcing a maximum load of 1 A.

The regulator include a CMOS logic-level-compatible enable pin (EN) to allow for user-customizable power management schemes. Other features include built-in current limit and thermal shutdown to protect the device and system during fault conditions.

The TPS7H1210-SEP device is designed using bipolar technology primarily for high-accuracy, low-noise applications, where clean voltage rails are critical to maximize system performance. Therefore, it ideal to power op amps, ADCs, DACs, and other high-performance analog circuitry.

Additionally, the TPS7H1210-SEP device is suitable for post DC-DC converter regulation. By filtering the output voltage ripple inherent to DC-DC switching conversion, maximum system performance is ensured in sensitive devices and RF applications.

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Technical documentation

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Type Title Date
* Data sheet TPS7H1210-SEP –16.5-V, 1-A, Negative Linear Regulator in Space Enhanced Plastic datasheet 23 Nov 2021
* VID TPS7H1210-SEP VID V62-21616 04 Jan 2022
* Radiation & reliability report TPS7H1210-SEP Single-Event Effects (SEE) Test Report 13 Dec 2021
* Radiation & reliability report TPS7H1210-SEP Neutron Displacement Damage (NDD) Characterization 24 Nov 2021
* Radiation & reliability report TPS7H1210-SEP Total Ionizing Dose (TID) 24 Nov 2021
* Radiation & reliability report TPS7H1210-SEP Production Flow and Reliability Report 08 Nov 2021
User guide TPS7H1210EVM User's Guide 22 Nov 2021
Technical article 3 quiescent-current (Iq) specifications you need to understand 12 Nov 2021
Certificate TPS7H1210EVM EU RoHS Declaration of Conformity (DoC) 04 Oct 2021
Selection guide TI Space Products (Rev. H) 27 Jan 2021
Application note Reduce the risk in NewSpace with Space Enhanced Plastic products 29 Jul 2019
E-book Radiation Handbook for Electronics (Rev. A) 21 May 2019

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

TPS7H1210EVM — TPS7H1210-SEP evaluation module for -3-V to -16.5-V input, 1-A, negative linear regulator

The TPS7H1210 evaluation module (EVM) is an engineering demonstration board for evaluating the TPS7H1210-SEP space-enhanced, low-dropout (LDO), negative-voltage linear regulator.

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Simulation model

TPS7H1210-SEP PSpice Transient Model

SBVM985.ZIP (23 KB) - PSpice Model
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VQFN (RGW) 20 View options

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