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LM211-EP

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LM211-EP

AKTIV
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Produktdetails

Number of channels 1 Output type Open-collector, Open-drain Propagation delay time (µs) 0.115 Vs (max) (V) 30 Vs (min) (V) 3.5 Vos (offset voltage at 25°C) (max) (mV) 3 Iq per channel (typ) (mA) 5.1 Input bias current (±) (max) (nA) 100 Rail-to-rail No Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125 Features Strobe, Vos Adj Pin VICR (max) (V) 28 VICR (min) (V) 0.5
Number of channels 1 Output type Open-collector, Open-drain Propagation delay time (µs) 0.115 Vs (max) (V) 30 Vs (min) (V) 3.5 Vos (offset voltage at 25°C) (max) (mV) 3 Iq per channel (typ) (mA) 5.1 Input bias current (±) (max) (nA) 100 Rail-to-rail No Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125 Features Strobe, Vos Adj Pin VICR (max) (V) 28 VICR (min) (V) 0.5
SOIC (D) 8 29.4 mm² 4.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • Fast Response Times
  • Strobe Capability
  • Maximum Input Bias Current . . . 300 nA
  • Maximum Input Offset Current . . . 70 nA
  • Can Operate From Single 5-V Supply

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • Fast Response Times
  • Strobe Capability
  • Maximum Input Bias Current . . . 300 nA
  • Maximum Input Offset Current . . . 70 nA
  • Can Operate From Single 5-V Supply

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+ or VCC-. Offset balancing and strobe capabilities are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input.

The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+ or VCC-. Offset balancing and strobe capabilities are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input.
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Alle anzeigen 4
Typ Titel Datum
* Data sheet LM211-EP datasheet (Rev. A) 22 Feb 2006
* VID LM211-EP VID V6203638 21 Jun 2016
* Radiation & reliability report LM211MDREP Reliability Report 07 Mai 2012
E-book The Signal e-book: A compendium of blog posts on op amp design topics 28 Mär 2017

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