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Circuitos integrados LVDS, M-LVDS y PECL

SN55LVDS31-SP

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SN55LVDS31-SP

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Detalles del producto

Function Driver Protocols LVDS Number of transmitters 4 Number of receivers 0 Supply voltage (V) 3.3 Signaling rate (MBits) 400 Input signal LVTTL Output signal LVDS Rating Space Operating temperature range (°C) -55 to 125
Function Driver Protocols LVDS Number of transmitters 4 Number of receivers 0 Supply voltage (V) 3.3 Signaling rate (MBits) 400 Input signal LVTTL Output signal LVDS Rating Space Operating temperature range (°C) -55 to 125
CFP (W) 16 69.319 mm² 10.3 x 6.73
  • QML-V Qualified, SMD 5962-97621
  • Meet or Exceed the Requirements of ANSI TIA/EIA-644 Standard
  • Low-Voltage Differential Signaling With Typical Output Voltage
    of 350 mV and 100-Ω Load
  • Typical Output Voltage Rise and Fall Times of 500 ps (400 Mbps)
  • Typical Propagation Delay Times of 1.7 ns
  • Operate From a Single 3.3-V Supply
  • Power Dissipation 25 mW Typical Per Driver at 200 MHz
  • Driver at High Impedance When Disabled or With VCC = 0
  • Bus-Terminal ESD Protection Exceeds 8 kV
  • Low-Voltage TTL (LVTTL) Logic Input Levels
  • Cold Sparing for Space and High Reliability Applications Requiring Redundancy
  • QML-V Qualified, SMD 5962-97621
  • Meet or Exceed the Requirements of ANSI TIA/EIA-644 Standard
  • Low-Voltage Differential Signaling With Typical Output Voltage
    of 350 mV and 100-Ω Load
  • Typical Output Voltage Rise and Fall Times of 500 ps (400 Mbps)
  • Typical Propagation Delay Times of 1.7 ns
  • Operate From a Single 3.3-V Supply
  • Power Dissipation 25 mW Typical Per Driver at 200 MHz
  • Driver at High Impedance When Disabled or With VCC = 0
  • Bus-Terminal ESD Protection Exceeds 8 kV
  • Low-Voltage TTL (LVTTL) Logic Input Levels
  • Cold Sparing for Space and High Reliability Applications Requiring Redundancy

The SN55LVDS31 is a differential line driver that implements the electrical characteristics of low-voltage differential signaling (LVDS). This signaling technique lowers the output voltage levels of 5-V differential standard levels (such as TIA/EIA-422B) to reduce the power, increase the switching speeds, and allow operation with a 3.3-V supply rail. This driver will deliver a minimum differential output voltage magnitude of 247 mV into a 100-Ω load when enabled.

The intended application of this device and signaling technique is both point-to-point and multidrop (one driver and multiple receivers) data transmission over controlled impedance media of approximately 100 Ω. The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN55LVDS31 is characterized for operation from –55°C to 125°C.

The SN55LVDS31 is a differential line driver that implements the electrical characteristics of low-voltage differential signaling (LVDS). This signaling technique lowers the output voltage levels of 5-V differential standard levels (such as TIA/EIA-422B) to reduce the power, increase the switching speeds, and allow operation with a 3.3-V supply rail. This driver will deliver a minimum differential output voltage magnitude of 247 mV into a 100-Ω load when enabled.

The intended application of this device and signaling technique is both point-to-point and multidrop (one driver and multiple receivers) data transmission over controlled impedance media of approximately 100 Ω. The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN55LVDS31 is characterized for operation from –55°C to 125°C.
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Documentación técnica

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Tipo Título Fecha
* Data sheet High-Speed Differential Line Driver - SN55LVDS31-SP datasheet 01 mar 2012
* SMD SN55LVDS31-SP SMD 5962-97621 08 jul 2016
* Radiation & reliability report SN55LVDS31 and SN55LVDS32 SEE Report 31 mar 2015
* Radiation & reliability report SN55LVDS31J Radiation Test Report 31 mar 2015
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 31 ago 2023
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) PDF | HTML 17 nov 2022
Application note Single-Event Effects Confidence Interval Calculations (Rev. A) PDF | HTML 19 oct 2022
Selection guide TI Space Products (Rev. I) 03 mar 2022
Application brief Space-Grade, 100-krad, Isolated Serial Peripheral Interface (SPI) LVDS Circuit PDF | HTML 29 jun 2021
E-book Radiation Handbook for Electronics (Rev. A) 21 may 2019

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Modelo de simulación

SN55LVDS31-SP IBIS MODEL

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