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LM239A-EP

활성

향상된 제품 쿼드 차동 콤퍼레이터

지금 주문
데이터 시트

LM239A-EP

활성
데이터 시트 지금 주문

제품 상세 정보

Number of channels 4 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 36 Vs (min) (V) 2 Rating HiRel Enhanced Product Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2.5 Rail-to-rail In to V- Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 50 VICR (max) (V) 34.5 VICR (min) (V) 0
Number of channels 4 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 36 Vs (min) (V) 2 Rating HiRel Enhanced Product Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2.5 Rail-to-rail In to V- Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 50 VICR (max) (V) 34.5 VICR (min) (V) 0
SOIC (D) 14 51.9 mm² 8.65 x 6 TSSOP (PW) 14 32 mm² 5 x 6.4
  • Wide Supply Ranges
    • Single Supply: 2 V to 36 V
      (Tested to 30 V for Non-V Devices and
      32 V for V-Suffix Devices)
    • Dual Supplies: ±1 V to ±18 V
      (Tested to ±15 V for Non-V Devices and
      ±16 V for V-Suffix Devices)
  • Low Supply-Current Drain Independent of Supply Voltage: 0.8 mA (Typ)
  • Low Input Bias Current: 25 nA (Typ)
  • Low Input Offset Current: 5 nA (Typ)
  • Low Input Offset Voltage: 2 mV (Typ)
  • Common-Mode Input Voltage Range Includes Ground
  • Differential Input Voltage Range Equal to Maximum-Rated Supply Voltage: ±36 V
  • Low Output Saturation Voltage
  • Output Compatible With TTL, MOS, and CMOS
  • APPLICATIONS
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Military (–55°C/125°C) Temperature Range(1)
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability

(1) Custom temperature ranges available
  • Wide Supply Ranges
    • Single Supply: 2 V to 36 V
      (Tested to 30 V for Non-V Devices and
      32 V for V-Suffix Devices)
    • Dual Supplies: ±1 V to ±18 V
      (Tested to ±15 V for Non-V Devices and
      ±16 V for V-Suffix Devices)
  • Low Supply-Current Drain Independent of Supply Voltage: 0.8 mA (Typ)
  • Low Input Bias Current: 25 nA (Typ)
  • Low Input Offset Current: 5 nA (Typ)
  • Low Input Offset Voltage: 2 mV (Typ)
  • Common-Mode Input Voltage Range Includes Ground
  • Differential Input Voltage Range Equal to Maximum-Rated Supply Voltage: ±36 V
  • Low Output Saturation Voltage
  • Output Compatible With TTL, MOS, and CMOS
  • APPLICATIONS
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Military (–55°C/125°C) Temperature Range(1)
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability

(1) Custom temperature ranges available

These devices consist of four independent voltage comparators that are designed to operate from a single power supply over a wide range of voltages. Operation from dual supplies also is possible, as long as the difference between the two supplies is 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. Current drain is independent of the supply voltage. The outputs can be connected to other open-collector outputs to achieve wired-AND relationships.

These devices consist of four independent voltage comparators that are designed to operate from a single power supply over a wide range of voltages. Operation from dual supplies also is possible, as long as the difference between the two supplies is 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. Current drain is independent of the supply voltage. The outputs can be connected to other open-collector outputs to achieve wired-AND relationships.
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기술 자료

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2개 모두 보기
유형 직함 날짜
* Radiation & reliability report LM239A-EP quad differential comparator reliability report (Rev. B) 2020/04/20
* Data sheet LM239A-EP datasheet (Rev. C) 2010/07/27

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

지원 및 교육

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포럼 주제 모두 보기(영문)

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