產品詳細資料

Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Catalog Supply current (max) (µA) 3000
Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Catalog Supply current (max) (µA) 3000
PDIP (N) 16 181.42 mm² 19.3 x 9.4 SOP (NS) 16 79.56 mm² 10.2 x 7.8 TSSOP (PW) 16 32 mm² 5 x 6.4
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 µA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 µA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.

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其他裝置和產品規格表

本產品規格表適用於 CD4511BCD4511B-MIL

技術文件

star =TI 所選的此產品重要文件
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重要文件 類型 標題 格式選項 日期
* Data sheet CMOS BCD-to-7-Segment Latch Decoder Drivers datasheet (Rev. B) 2003年 6月 27日
Selection guide Logic Guide (Rev. AC) PDF | HTML 2025年 11月 13日
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
User guide LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
User guide Signal Switch Data Book (Rev. A) 2003年 11月 14日
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 2001年 12月 3日

設計與開發

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開發板

14-24-LOGIC-EVM — 適用於 14 針腳至 24 針腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產品通用評估模組

14-24-LOGIC-EVM 評估模組 (EVM) 設計用於支援任何 14 針腳至 24 針腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯裝置。

使用指南: PDF | HTML
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參考設計

TIDA-00480 — 汽車霍爾感測器旋轉編碼器

這是一款增量式旋轉編碼器,使用非接觸式磁性感測來偵測旋轉速度和方向。  兩組霍爾效應感測器測量 66 極環形磁鐵,並輸出兩組正交信號。  這套符合汽車標準的解決方案是傳統機械接觸式編碼器的替代方案,成本更低、可靠性更強,因為其採用的固態感測,不受實體磨損,灰塵、腐蝕和 RF 雜訊影響。
使用指南: PDF
電路圖: PDF
封裝 針腳 CAD 符號、佔位空間與 3D 模型
PDIP (N) 16 Ultra Librarian
SOP (NS) 16 Ultra Librarian
TSSOP (PW) 16 Ultra Librarian

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  • MTBF/FIT 估算值
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  • 認證摘要
  • 進行中的可靠性監測
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