DAC121S101-SEP
- Radiation tolerance:
- Total ionizing dose (TID): 30krad (Si)
- Single-event latch-up (SEL): 43MeV-cm2/mg
- Single-event functional interrupt (SEFI): 43MeV-cm2/mg
- Space-enhanced plastic (space EP):
- Outgassing test performed per ASTM E595
- Vendor item drawing (VID) V62/24641
- Supports defense and aerospace application temperature range: –55°C to +125°C
- Controlled baseline
- One assembly and test site
- One fabrication site
- Extended product life cycle
- Product traceability
- Specified monotonicity
- Low-power operation
- Rail-to-rail voltage output
- Power-on reset to zero-scale output
- Wide power-supply range of 2.7V to 5.5V
- Small package:
- 8-pin VSSOP (3mm × 3mm)
- Power-down feature
- Key specifications:
- 12-bit resolution
- DNL: −0.15LSB, +0.35LSB (typical)
- 12µs output settling time (typical)
- 4mV zero-code error (typical)
- Full-scale error at −0.07%FSR (typical)
The DAC121S101-SEP device is a full-featured, general-purpose, 12-bit voltage-output digital-to-analog converter (DAC) that can operate from a single 2.7V to 5.5V supply and consumes just 177µA (typical) of current at 3.6V. The on-chip output amplifier allows rail-to-rail output swing and the three wire serial interface operates at clock rates up to 30MHz over the specified supply voltage range and is compatible with standard SPI, QSPI, MICROWIRE and DSP interfaces.
The supply voltage serves as the voltage reference for the DAC121S101-SEP, providing the widest possible output dynamic range. A power-on reset circuit powers up the DAC output to zero volts until there is a valid write to the device. A power-down feature reduces power consumption to less than a microwatt (typical).
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | DAC121S101-SEP 12-Bit, Micro Power, RRO Digital-to-Analog Converter datasheet | PDF | HTML | 2024/12/11 | ||
| * | 輻射及可靠性報告 | DAC121S101-SEP Single-Event Latch-Up (SEL) Radiation Report (Rev. A) | PDF | HTML | 2026/6/25 | ||
| * | 輻射及可靠性報告 | DAC121S101-SEP Radiation Tolerant, CMOS, 12-Bit Digital to Analog Converter (DAC) TID Report | PDF | HTML | 2024/12/12 | ||
| * | 輻射及可靠性報告 | DAC121S101-SEP Production Flow and Reliability Report | PDF | HTML | 2024/12/11 | ||
| Application brief | Space Grade 12A Laser Diode Driver | PDF | HTML | 2026/2/17 |
設計與開發
如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。
DAC121S101SEPEVM — DAC121S101-SEP 評估模組
DAC121S101-SEP 評估模組 (EVM) 是一個易於使用的平台，用於評估 DAC121S101-SEP 產品的功能與性能。此 EVM 具有選用電路和跨接器，可針對不同應用來配置產品。
DAC121S101-SEP 裝置為全功能、通用、12 位元電壓輸出數位轉類比轉換器 (DAC)，可透過單一 2.7V 至 5.5V 電源運作，且在 3.6V 時僅消耗 177µA 電流。
DAC121S101SEPEVM-GUI — Labview GUI for the DAC121S101SEPEVM
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| VSSOP (DGK) | 8 | Ultra Librarian |
訂購與品質
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。