產品詳細資料

Rating Space Architecture Gate driver Vs (min) (V) 5 Vs ABS (max) (V) 57.5 Operating temperature range (°C) -55 to 125
Rating Space Architecture Gate driver Vs (min) (V) 5 Vs ABS (max) (V) 57.5 Operating temperature range (°C) -55 to 125
TSSOP (PW) 20 41.6 mm² (6.5 mm × 6.4 mm)
  • 40V Three Phase Half-Bridge Gate driver
    • Drives N-Channel MOSFETs (NMOS)
    • Gate Driver Supply (GVDD): 5-15V
    • MOSFET supply (SHx) supports up to 40V
  • Radiation Performance
    • SEL, SEB, and SET resistant up to LET = 43 MeV-cm2 /mg
    • SET and SEFI characterized up to LET = 43 MeV-cm2 /mg
    • TID assured for every wafer lot up to 30 krad(Si)
    • TID characterized up to 30 krad(Si)
    • Cross conduction event is observed during SEE and SEB. Refer to SEE report for more details.
  • Space-enhanced plastic (space EP):
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication site
    • Extended Product Life Cycle
    • Product Traceability
  • Integrated Bootstrap Diodes
  • Supports Inverting and Non-Inverting INLx inputs
  • Bootstrap gate drive architecture
    • 750mA source current
    • 1.5- sink current
  • Low leakage current on SHx pins (<55µA)
  • Absolute maximum BSTx voltage up to 57.5V
  • Supports negative transients up to -22V on SHx
  • Fixed deadtime insertion of 200nS
  • Supports 3.3V and 5V logic inputs with 20V Abs max
  • 4nS typical propagation delay matching
  • Compact TSSOP package
  • Efficient system design with Power Blocks
  • Integrated protection features
    • BST undervoltage lockout (BSTUV)
    • GVDD undervoltage (GVDDUV)
  • 40V Three Phase Half-Bridge Gate driver
    • Drives N-Channel MOSFETs (NMOS)
    • Gate Driver Supply (GVDD): 5-15V
    • MOSFET supply (SHx) supports up to 40V
  • Radiation Performance
    • SEL, SEB, and SET resistant up to LET = 43 MeV-cm2 /mg
    • SET and SEFI characterized up to LET = 43 MeV-cm2 /mg
    • TID assured for every wafer lot up to 30 krad(Si)
    • TID characterized up to 30 krad(Si)
    • Cross conduction event is observed during SEE and SEB. Refer to SEE report for more details.
  • Space-enhanced plastic (space EP):
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication site
    • Extended Product Life Cycle
    • Product Traceability
  • Integrated Bootstrap Diodes
  • Supports Inverting and Non-Inverting INLx inputs
  • Bootstrap gate drive architecture
    • 750mA source current
    • 1.5- sink current
  • Low leakage current on SHx pins (<55µA)
  • Absolute maximum BSTx voltage up to 57.5V
  • Supports negative transients up to -22V on SHx
  • Fixed deadtime insertion of 200nS
  • Supports 3.3V and 5V logic inputs with 20V Abs max
  • 4nS typical propagation delay matching
  • Compact TSSOP package
  • Efficient system design with Power Blocks
  • Integrated protection features
    • BST undervoltage lockout (BSTUV)
    • GVDD undervoltage (GVDDUV)

DRV8351-SEP is a three phase half-bridge gate driver, capable of driving high-side and low-side N-channel power MOSFETs. The DRV8351-SEPD generates the correct gate drive voltages using an integrated bootstrap diode and external capacitor for the high-side MOSFETs. GVDD is used to generate gate drive voltage for the low-side MOSFETs. The Gate Drive architecture supports peak up to 750mA source and 1.5A sink currents.

The phase pins SHx are able to tolerate significant negative voltage transients; while high side gate driver supply BSTx and GHx can support higher positive voltage transients (57.5V) abs max voltage which improve the robustness of the system. Small propagation delay and delay matching specifications minimize the dead-time requirement which further improves efficiency. Undervoltage protection is provided for both low and high sides through GVDD and BST undervoltage lockout.

DRV8351-SEP is a three phase half-bridge gate driver, capable of driving high-side and low-side N-channel power MOSFETs. The DRV8351-SEPD generates the correct gate drive voltages using an integrated bootstrap diode and external capacitor for the high-side MOSFETs. GVDD is used to generate gate drive voltage for the low-side MOSFETs. The Gate Drive architecture supports peak up to 750mA source and 1.5A sink currents.

The phase pins SHx are able to tolerate significant negative voltage transients; while high side gate driver supply BSTx and GHx can support higher positive voltage transients (57.5V) abs max voltage which improve the robustness of the system. Small propagation delay and delay matching specifications minimize the dead-time requirement which further improves efficiency. Undervoltage protection is provided for both low and high sides through GVDD and BST undervoltage lockout.

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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 DRV8351-SEP: 40V Three-Phase BLDC Gate Driver datasheet (Rev. A) PDF | HTML 2025/4/30
* 輻射及可靠性報告 DRV8351-SEP Single-Event Effects (SEE) Report PDF | HTML 2025/1/22
* 輻射及可靠性報告 DRV8351-SEP Production Flow and Reliability Report PDF | HTML 2025/1/21
* 輻射及可靠性報告 DRV8351-SEP Total Ionizing Dose (TID) Report PDF | HTML 2024/12/12

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DRV8351EVM — DRV8351 評估模組

DRV8351-SEP 評估模組 (EVM) 是 30A 3 相位無刷 DC 驅動級,且以適用於 BLDC 馬達的 DRV8351-SEP 閘極驅動器為基礎。DRV8351-SEP 包含三個二極體以供靴帶運作,無需使用外部二極體。EVM 包括三個電流分流放大器,適用於低壓側電流量測,以及 PVDD/GVDD 電壓和基板溫度的回饋。可向 EVM 提供最高 40V 電壓,而板載降壓則可產生靴帶式 GVDD 供應所需的 12V 電壓。所有電源供應器的狀態 LED 及故障 LED 均包含在內,以供使用者回饋。需要 C2000TM LaunchPadTM 開發套件 (...)
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