產品詳細資料

Technology family LS Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 13000
Technology family LS Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 13000
CDIP (J) 16 135.3552 mm² 19.56 x 6.92 LCCC (FK) 20 79.0321 mm² 8.89 x 8.89
  • '46A, '47A, 'LS47 feature
    • Open-Collector Outputs Drive Indicators Directly
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • '48, 'LS48 feature
    • Internal Pull-Ups Eliminate Need for External Resistors
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • 'LS49 feature
    • Open-Collector Outputs
    • Blanking Input
  • All Circuit Types Feature Lamp Intensity Modulation Capability
  • '46A, '47A, 'LS47 feature
    • Open-Collector Outputs Drive Indicators Directly
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • '48, 'LS48 feature
    • Internal Pull-Ups Eliminate Need for External Resistors
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • 'LS49 feature
    • Open-Collector Outputs
    • Blanking Input
  • All Circuit Types Feature Lamp Intensity Modulation Capability

The '46A, '47A, and 'LS47 feature active-low outputs designed for driving, common-anode LEDs or incandescent indicators directly. The '48, 'LS48, and 'LS49 feature active-high outputs for driving lamp buffers or common-cathode LEDs. All of the circuits except 'LS49 have full ripple-blanking input/output controls and a lamp test input. The 'LS49 circuit incorporates a direct blanking input. Segment identification and resultant displays are shown below. Display patterns for BCD input counts above 9 are unique symbols to authenticate input conditions.

The '46A, '47A, '48, 'LS47, and 'LS48 circuits incorporate automatic leading and/or trailing-edge zero-blanking control (RBI\ and RBO\). Lamp test (LT\) of these types may be performed at any time when the BI\/RBO\ node is at a high level. All types (including the '49 and 'LS49) contain an overriding blanking input (BI\), which can be used to control the lamp intensity by pulsing or to inhibit the outputs. Inputs and outputs are entirely compatible for use with TTL logic outputs.

The SN54246/SN74246 and '247 and the SN54LS247/SN74LS247 and 'LS248 compose the 6 and the 9 with tails and were designed to offer the designer a choice between two indicator fonts.

The '46A, '47A, and 'LS47 feature active-low outputs designed for driving, common-anode LEDs or incandescent indicators directly. The '48, 'LS48, and 'LS49 feature active-high outputs for driving lamp buffers or common-cathode LEDs. All of the circuits except 'LS49 have full ripple-blanking input/output controls and a lamp test input. The 'LS49 circuit incorporates a direct blanking input. Segment identification and resultant displays are shown below. Display patterns for BCD input counts above 9 are unique symbols to authenticate input conditions.

The '46A, '47A, '48, 'LS47, and 'LS48 circuits incorporate automatic leading and/or trailing-edge zero-blanking control (RBI\ and RBO\). Lamp test (LT\) of these types may be performed at any time when the BI\/RBO\ node is at a high level. All types (including the '49 and 'LS49) contain an overriding blanking input (BI\), which can be used to control the lamp intensity by pulsing or to inhibit the outputs. Inputs and outputs are entirely compatible for use with TTL logic outputs.

The SN54246/SN74246 and '247 and the SN54LS247/SN74LS247 and 'LS248 compose the 6 and the 9 with tails and were designed to offer the designer a choice between two indicator fonts.

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技術文件

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類型 標題 日期
* Data sheet BCD-to-Seven-Segment Decoders/Drivers datasheet 1988年 3月 1日
* SMD SN54LS47 SMD 7604501EA 2016年 6月 21日
Selection guide Logic Guide (Rev. AB) 2017年 6月 12日
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
User guide LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
Application note TI IBIS File Creation, Validation, and Distribution Processes 2002年 8月 29日
Application note Designing With Logic (Rev. C) 1997年 6月 1日
Application note Designing with the SN54/74LS123 (Rev. A) 1997年 3月 1日
Application note Input and Output Characteristics of Digital Integrated Circuits 1996年 10月 1日
Application note Live Insertion 1996年 10月 1日

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CDIP (J) 16 檢視選項
LCCC (FK) 20 檢視選項

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  • 資格摘要
  • 進行中可靠性監測
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