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TLV3011-Q1
- Qualified for automotive applications
- AEC-Q100 qualified with the following results:
- Device temperature grade 1: –40°C to +125°C ambient operating temperature range
- Device HBM ESD classification level 2
- Device CDM ESD classification level C3
- Low quiescent current: 3.1µA (maximum, "B" version)
- Integrated voltage reference: 1.242V
- Input common-mode range: 200mV beyond rails
- Voltage reference initial accuracy: 1.5%
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Built-in hysteresis: 6mV (typical)
- Fail-safe inputs ("B" version)
- Power-on-reset ("B" version)
-
Open drain output option (TLV3011x-Q1)
-
Push-pull output option (TLV3012x-Q1)
-
Fast response time: 2µS ("B" version)
- Low supply voltage = 1.65V to 5.5V ("B" version)
The TLV3011-Q1 is a low-power, open-drain output comparator; the TLV3012-Q1 is a push-pull output comparator. Both devices feature an uncommitted on-chip voltage reference and have a 5µA (maximum) quiescent current, an input common-mode range 200mV beyond the supply rails, and single-supply operation from 1.8V to 5.5V. The integrated 1.242V series voltage reference offers low 100ppm/°C (maximum) drift, is stable with up to 10nF capacitive load, and can provide up to 0.5mA (typical) of output current.
The TLV3011B-Q1 and TLV3012B-Q1 "B" versions add power-on-reset (POR), fail-safe inputs, lower minimum supply voltage of 1.65V and a 3.1µA maximum quiescent current.
The family is available in both the tiny SOT23-6 package for space-conservative designs, and in the SC-70 package for even greater board area savings. All versions are specified for the temperature range of –40°C to +125°C.
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | TLV3011 -Q1 , TLV3012 -Q1 , TLV3011B -Q1 and TLV3012B -Q1 Low-Power Comparators With Integrated 1.24V Voltage Reference datasheet (Rev. D) | PDF | HTML | 2025/1/9 | ||
| Circuit design | Low-power, bidirectional current-sensing circuit (Rev. B) | PDF | HTML | 2024/10/2 | |||
| Circuit design | Undervoltage protection with comparator circuit (Rev. A) | PDF | HTML | 2024/9/27 | |||
| Application brief | Voltage Supervision with a Comparator | PDF | HTML | 2023/9/28 | |||
| Circuit design | Circuit for voltage monitoring in eCall telematics control units | 2020/1/16 | ||||
| 電子書 | The Signal e-book: A compendium of blog posts on op amp design topics | PDF | HTML | 2017/3/28 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8 和 SOIC-14)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV (SOT23-5 和 SOT23-6)
- DCK (SC70-5 和 SC70-6)
DIP-ADAPTER-EVM — DIP 轉接器評估模組
Speed up your op amp prototyping and testing with the DIP-Adapter-EVM, which provides a fast, easy and inexpensive way to interface with small, surface-mount ICs. You can connect any supported op amp using the included Samtec terminal strips or wire them directly to existing circuits.
The (...)
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOT-23 (DBV) | 6 | Ultra Librarian |
| SOT-SC70 (DCK) | 6 | Ultra Librarian |
訂購與品質
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。