Alpha Data® board for Xilinx® Kintex® UltraScale™ XQRKU060 FPGA with TI power


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This is a development kit for the Xilinx® XQRKU060 FPGA with industrial -1 speed grade. ADA-SDEV-KIT2 has a modular board design with a XRTC-compatible configuration module, two FMC connectors, DDR3 DRAM, system monitoring, and space-grade TI power management and temperature-sensing solutions.

Buck converters (integrated switch)
TPS50601A-SP Radiation-hardness-assured (RHA), 3-V to 7-V input, 6-A synchronous step-down converter TPS7H4001-SP Radiation-hardness-assured (RHA), 3-V to 7-V input, 18-A, synchronous step-down converter


DDR memory power ICs
TPS7H3301-SP Radiation-hardness-assured (RHA) 3-A sink/source DDR termination linear regulator


Digital temperature sensors
TMP461-SP Radiation-hardness-assured (RHA), high-accuracy remote and local temperature sensor


Linear & low-dropout (LDO) regulators
TPS7H1101A-SP Radiation-hardness-assured (RHA), 1.5-V to 7-V input, 3-A low-noise low-dropout (LDO) regulator

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Development kit

ADA-SDEV-KIT – Alpha Data® board for Xilinx® Kintex® UltraScale™ XQRKU060 FPGA with TI power

Version: v3
TI's Standard Terms and Conditions for Evaluation Items apply.

Technical documentation

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Type Title Date
White paper Powering a New Era of High-Performance Space-Grade Xilinx FPGAs Mar. 29, 2021
Selection guide TI Space Products (Rev. H) Jan. 27, 2021
Radiation & reliability report TMP461-SP Total Ionizing Dose (TID) Report (Rev. C) Jan. 04, 2021
Radiation & reliability report Single-Event Effects Test Report for TMP461-SP High-Accuracy Remote and Local (Rev. B) Jan. 04, 2021
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations May 18, 2020
Application note Single-Event Effects Confidence Interval Calculations Jan. 14, 2020
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing Jun. 17, 2019
Radiation & reliability report TPS50601A-SP Total Ionizing Dose (TID) Radiation Report (Rev. B) May 30, 2019
Radiation & reliability report TPS50601A-SP Single-event Effects (SEE) Test Report (Rev. A) Feb. 05, 2019
Radiation & reliability report TMP461-SP (5962R1721701VXC) Neutron Displacement Damage Characterization Sep. 10, 2018
Application note Use of an LDO as a Load Switch for Space Applications Aug. 01, 2018
Radiation & reliability report TPS50601A-SP Neutron Displacement Damage (NDD) Characterization Report (Rev. A) Jul. 24, 2018
Application note Conditional Stability in Feedback Systems Feb. 21, 2018
Radiation & reliability report TPS7H1101-SP Neutron Displacement Damage Characterization Report Oct. 23, 2017
Radiation & reliability report TPS7H3301-SP Single-Event Effects Radiation Report (Rev. A) Jan. 25, 2017
Application note External Soft-Start Circuit for TPS7H3301-SP Power-Up Sequencing Applications Jul. 07, 2016
Radiation & reliability report TPS7H3301-SP Total Ionizing Dose Radiation Report Jul. 01, 2016
Radiation & reliability report TPS7H1101‐SP TID and SEE Report (Rev. A) Apr. 27, 2015

Related design resources

Hardware development

TMP461EVM-CVAL Radiation Hardness Assured (RHA) High-Accuracy Remote and Local Temperature Sensor Evaluation Module TPS50601ASPEVM-D TPS50601A-SP dual-operation evaluation module TPS50601ASPEVM-S TPS50601A-SP single-operation evaluation module TPS7H1101SPEVM TPS7H1101SPEVM Evaluation Module TPS7H3301EVM-CVAL TPS7H3301-SP DDR Termination Evaluation Module TPS7H4001EVM-CVAL 1-channel, 18-A, 3-V to 7-V input, synchronous step-down converter evaluation module TPS7H4001QEVM-CVAL 4-channel, 72-A, 3-V to 7-V input, synchronous step-down converter evaluation module

Support & training

Third-party support
TI does not offer ongoing direct design support for this hardware. For support while working through your design, contact Alpha Data Parallel Systems Ltd..



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