SPRACF4C June   2018  – January 2023 AWR1243 , AWR1443 , AWR1642 , AWR1843 , AWR1843AOP , AWR2243 , AWR6843 , AWR6843AOP , IWR1843 , IWR6443 , IWR6843 , IWR6843AOP

 

  1.   Trademarks
  2. 1Introduction
    1. 1.1 Purpose of Calibrations
    2. 1.2 Purpose of Monitoring Mechanisms
  3. 2Hardware Infrastructure to Support Calibration and Monitoring
  4. 3List of Calibrations
    1. 3.1  APLL Calibration
    2. 3.2  Synthesizer VCO Calibration
    3. 3.3  LO Distribution Calibration
    4. 3.4  ADC DC Offset Calibration
    5. 3.5  HPF Cutoff Calibration
    6. 3.6  LPF Cutoff Calibration
    7. 3.7  Peak Detector Calibration
    8. 3.8  TX Power Calibration
    9. 3.9  RX Gain Calibration
    10. 3.10 IQ Mismatch Calibration
    11. 3.11 TX Phase Shifter Calibration
  5. 4Impact of Calibration on Gain and Phase
  6. 5Impact of Interference on the Calibrations and Emissions Caused Due to Calibrations
  7. 6Scheduling of Runtime Calibration and Monitoring
    1. 6.1 Selection of CALIB_MON_TIME_UNIT
    2. 6.2 Selection of CALIBRATION_PERIODICITY
    3. 6.3 Application-Controlled One Time Calibration
  8. 7Software Controllability of Calibration
    1. 7.1  Calibration and Monitoring Frequency Limits
    2. 7.2  Calibration and Monitoring TX Frequency and Power Limit
    3. 7.3  Calibration Status Reports
      1. 7.3.1 RF Initialization Calibration Completion
      2. 7.3.2 Runtime Calibration Status Report
      3. 7.3.3 Calibration/Monitoring Timing Failure Status Report
    4. 7.4  Programming CAL_MON_TIME_UNIT
    5. 7.5  Calibration Periodicity
    6. 7.6  RF Initialization Calibration
    7. 7.7  Runtime Calibration
    8. 7.8  Overriding the TX Power Calibration LUT
    9. 7.9  Overriding the RX Gain Calibration LUT
    10. 7.10 Retrieving and Restoring Calibration Data
  9. 8References
  10.   A Calibration and Monitoring Durations
    1.     A.1 Duration of Boot Time Calibrations
  11.   Revision History

LO Distribution Calibration

A set of buffers are used to distribute the high frequency RF clock to the Rx and Tx sections. In TI’s first generation MMICs (xWR1243, xWR1642, xWR1443, xWR6843, xWR6443, and xWR1843), there is a fixed look up table (LUT) based on the temperature that controls the bias setting of the buffers. In second generation MMICs (xWR2243 and AWR294x), the buffer output signal swing is maintained and optimized using a combination of closed loop calibration using mmWave power detectors (for mitigating process variation) and temperature-based look up tables.