SPRT759 October   2023 TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28075 , TMS320F28075-Q1 , TMS320F28076 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Overview of IEC 60730 and UL 1998 Classifications
    1. 2.1 C2000 Capability by Device Family
  6. 3C2000 Safety Collateral
    1. 3.1 Getting Started
    2. 3.2 Functional Safety Manuals
    3. 3.3 Software Collateral
  7. 4Implementing Acceptable Measures on C2000 Real-Time MCUs
    1. 4.1 Implementation Steps
    2. 4.2 Example Mapping
    3. 4.3 Additional Best Practices
  8. 5Mapping Acceptable Control Measures to C2000 Unique Identifiers
    1. 5.1 Unique Identifier Reference
    2. 5.2 CPU Related Faults
    3. 5.3 Interrupt Related Faults
    4. 5.4 Clock Related Faults
    5. 5.5 Memory Related Faults
    6. 5.6 Internal Data Path Faults
    7. 5.7 Input/Output Related Faults
    8. 5.8 Communication, Monitoring Devices, and Custom Chip Faults
  9. 6Glossary
  10. 7References

5.3 Interrupt Related Faults

Table 5-4 Interrupt Faults to Unique ID Mapping
Component Class B/1 (1) Class C/2 (1) Acceptable Measure (6) C2000 Unique IDs (5)
Definition Description F2837x
F2807x		 F2838x F28004x F28002x F28003x
2. Interrupts rq H.2.16.5
A5.5 		Functional test PIE1 PIE1 PIE1 PIE1 PIE1
PIE2 PIE2 PIE2 PIE2 PIE2
PIE3 PIE3 PIE3 PIE3 PIE3
PIE6 PIE6 PIE6 PIE6 PIE6
H.2.18.10.4
A7.1.13		 Time slot monitoring PIE8 PIE8 PIE8 PIE8 PIE8
rq H.2.18.15
A7.1.19		 Reciprocal comparison CPU1 CPU1 CPU1 - CPU1
CLA1 CLA1 CLA1 - CLA1
H.2.18.3
A7.1.6		 Independent hardware comparator - - - - -
H.2.18.10.3
A7.1.14		 Independent time-slot and logical monitoring PIE8 PIE8 PIE8 PIE8 PIE8
(1) rq: coverage of the failure mode (refer to Table 2-2) is required by the standards for the indicated class. More than one acceptible measure may be available to choose from.
(6) Refer to the IEC / UL specifications for a complete list of acceptable measures and their definitions.
(5) Refer to the Functional Safety Manual for a description and implementation suggestions for each ID.