SBOA578 January 2025 TMCS1123 , TMCS1123-Q1 , TMCS1126 , TMCS1127 , TMCS1127-Q1 , TMCS1133 , TMCS1133-Q1
The setup for the experiments performed in this application note is comprised of a high-amperage current load in series with the devices under test, and necessary power supplies to drive the load. Figure 3-1 shows a rendering of the board used. From the diagram, note that for each test, all five samples for a given board weight or polygon size were run simultaneously, in series such that all boards can see the same current.
Labview was employed to automate the process, as thermal equilibrium was time consuming to make sure true thermal equilibrium between points. The following steps were performed on each board to capture the below curves:
Note that while the same topology of the EVM was used, the addition of series busbars effectively changes the impedance profile of the board, and also creates local heat signatures on the total EVM. This resulted in a reduction of total load each device can manage, but allowed for streamline testing over the full current range. Another observation made during these tests is that thermal efficiency in the connections of the lugs and busbars is paramount, as well as copper plane integrity. Care needs to be taken to make sure that copper is not damaged during assembly, and that connections are tight to make sure as little thermal resistance as possible.