SLLSG09 August   2026 TCAN2947-Q1 , TCAN2957-Q1

ADVANCE INFORMATION  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 IEC ESD Ratings
    4. 6.4 Recommended Operating Conditions
    5. 6.5 Thermal Information
    6. 6.6 Supply Characteristics
    7. 6.7 Electrical Characteristics
    8. 6.8 Timing Requirements
    9. 6.9 Switching Characteristics
  8. 7 Parameter Measurement Information
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  VCC1 Regulator
      2. 8.3.2  VCC2 Regulator
      3. 8.3.3  VEXCC Regulator
        1. 8.3.3.1 VEXCC in Stand-alone Configuration
        2. 8.3.3.2 VEXCC in Load-Sharing Conguration with VCC1
          1. 8.3.3.2.1 VEXCC: Unused Pins Configuration
      4. 8.3.4  CAN FD Transceiver
        1. 8.3.4.1 Driver and Receiver Function
        2. 8.3.4.2 CAN Bus Biasing
      5. 8.3.5  LIN Transceiver
        1. 8.3.5.1 LIN Transmitter Characteristics
        2. 8.3.5.2 LIN Receiver Characteristics
        3. 8.3.5.3 LIN Termination
      6. 8.3.6  High-Side Switches
      7. 8.3.7  WAKE and Voltage Monitoring Input
        1. 8.3.7.1 WAKE Pins Alternate Configurations
          1. 8.3.7.1.1 VBAT monitoring
          2. 8.3.7.1.2 Direct Drive
          3. 8.3.7.1.3 Using Wake Pins For Hardware ID Function
      8. 8.3.8  nRST Pin
      9. 8.3.9  LIMP Output
      10. 8.3.10 Interrupt Function
      11. 8.3.11 SW Pin
      12. 8.3.12 GFO Pin
      13. 8.3.13 Wake Features
        1. 8.3.13.1 CAN Bus Wake via CRXD Request (BWRR) in Sleep Mode
        2. 8.3.13.2 LIN Bus Wake
        3. 8.3.13.3 Local Wake Up (LWU) via WAKEx Input Terminal
          1. 8.3.13.3.1 Static Wake
          2. 8.3.13.3.2 Cyclic Sensing Wake
        4. 8.3.13.4 Cyclic Wake
        5. 8.3.13.5 Direct Drive in Sleep Mode
      14. 8.3.14 Long Duration Timer
      15. 8.3.15 Safety Features
        1. 8.3.15.1  Watchdog
          1. 8.3.15.1.1 Watchdog Error Counter and Action
          2. 8.3.15.1.2 Watchdog SPI Programming
            1. 8.3.15.1.2.1 Watchdog Configuration Registers Lock and Unlock
          3. 8.3.15.1.3 Watchdog Timing
          4. 8.3.15.1.4 Question and Answer Watchdog
            1. 8.3.15.1.4.1 WD Question and Answer Basic Information
            2. 8.3.15.1.4.2 Question and Answer Register and Settings
            3. 8.3.15.1.4.3 WD Question and Answer Value Generation
              1. 8.3.15.1.4.3.1 Answer Comparison
              2. 8.3.15.1.4.3.2 Sequence of the 2-bit Watchdog Answer Counter
            4. 8.3.15.1.4.4 Question and Answer WD Example
              1. 8.3.15.1.4.4.1 Example Configuration for Desired Behavior
              2. 8.3.15.1.4.4.2 Example of Performing a Question and Answer Sequence
        2. 8.3.15.2  Under/Over Voltage Lockout and Unpowered Device
          1. 8.3.15.2.1 Under-voltage
            1. 8.3.15.2.1.1 VSUP and VHSS Under-voltage
            2. 8.3.15.2.1.2 VCC1 Under-voltage
            3. 8.3.15.2.1.3 VCC2 and VEXCC Under-voltage
            4. 8.3.15.2.1.4 VCAN Under-voltage
          2. 8.3.15.2.2 VCC1, VCC2 and VEXCC Over-voltage
          3. 8.3.15.2.3 VCC1, VCC2 and VEXCC Short Circuit
        3. 8.3.15.3  Analog Built-in Self Test (ABIST)
        4. 8.3.15.4  Clock Monitoring
        5. 8.3.15.5  Bandgap Cross-Monitoring
        6. 8.3.15.6  Device Reset
        7. 8.3.15.7  Floating Terminals
        8. 8.3.15.8  LIN Bus Stuck Dominant System Fault: False Wake Up Lockout
        9. 8.3.15.9  Thermal Shutdown
        10. 8.3.15.10 Bus Fault Detection and Communication
      16. 8.3.16 SPI Communication
        1. 8.3.16.1 Cyclic Redundancy Check
        2. 8.3.16.2 Chip Select Not (nCS):
        3. 8.3.16.3 SPI Clock Input (SCK):
        4. 8.3.16.4 SPI Data Input (SDI):
        5. 8.3.16.5 SPI Data Output (SDO):
    4. 8.4 Device Functional Modes
      1. 8.4.1 Init Mode
      2. 8.4.2 Normal Mode
      3. 8.4.3 Standby Mode
      4. 8.4.4 Restart Mode
      5. 8.4.5 Fail-safe Mode
      6. 8.4.6 Sleep Mode
  10. 9 Device Registers
  11. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
        1. 10.2.1.1 Normal Mode Application Note
        2. 10.2.1.2 Standby Mode Application Note
        3. 10.2.1.3 LTXD Dominant State Timeout Application Note
      2. 10.2.2 Detailed Design Procedures
        1. 10.2.2.1 CAN Detailed Design Procedure
        2. 10.2.2.2 LIN Detailed Design Procedures
      3. 10.2.3 Device Brownout information
    3. 10.3 Power Supply Recommendations
    4. 10.4 Layout
      1. 10.4.1 Layout Guidelines
      2. 10.4.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 CAN Transceiver Physical Layer Standards:
      2. 11.1.2 LIN Transceiver Physical Layer Standards
      3. 11.1.3 EMC Requirements:
      4. 11.1.4 Conformance Test Requirements:
      5. 11.1.5 Related Documentation
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Support Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  13. 12Revision History
  14. 13Mechanical, Packaging, and Orderable Information
    1. 13.1 Tape and Reel Information
    2. 13.2 Mechanical Data

8.3.7 WAKE and Voltage Monitoring Input

WAKE1, WAKE2 and WAKE3/DIR pins are ground biased local wake up (LWU) input pins that are high voltage tolerant. This function is explained further in Section 8.3.13.3. The pins can be both rising and falling edge trigger, meaning it recognizes a LWU on either edge of WAKE pin transition. The pin can be configured to accept a pulse, see Figure 8-23 for timing diagram of this behavior. The WAKE pins are default enabled but can be disabled by using register 8'h2A[7:5], WAKE_PIN_SET, to turn off individual ones. Register 8'h11[7:6] sets the method the pins will use to register a wake event. These pins can be configured for cyclic sensing wake, see Section 8.3.13.3.2, or static wake.

The WAKE pins have four individual thresholds that can be set for a state change.

  • Register 8'h12[1:0], WAKE1_LEVEL
  • Register 8'h2B[5:4], WAKE2_LEVEL
  • Register 8'h2B[1:0], WAKE3_LEVEL
Note: If WAKEx_LEVEL = 10b or 11b is selected and uses static wake, the system designer needs to make sure that VSUP does not cross the wake pin threshold; otherwise, a false wake up can take place. Normal undervoltage events on VSUP does not cause this to take place.
Register 8'h2A[4:0], MULTI_WAKE_STAT, provides which WAKE pin or combination of WAKE pins caused the LWU event. The individual status of the pins, low or high, can be read via SPI in any mode that SPI is available.
  • Register 8'h11[5], WAKE1_STAT
  • Register 8'h2B[6], WAKE2_STAT
  • Register 8'h2B[2], WAKE3_STAT