11 Revision History
Changes from Revision D (April 2024) to Revision E (April 2026)
- Updated the numbering format for tables, figures, and cross-references
throughout the documentGo
- Changed storage temperature minimum from: −40°C to: −55°CGo
- Added voltage slew rate on drain side input pins (VS, CS+, CS–,
ISCP)Go
- Added I(CS−) input bias currentGo
- Updated Figure 8-6
Go
- Changed charge pump voltage reference from: 11V to: 12VGo
- Added Overcurrent and Short-Circuit Protection sectionGo
- Moved Equation 6 from: Detailed Design Procedure to: Overcurrent and Short-Circuit
ProtectionGo
- Updated Equation 6 to include comparator offset voltageGo
- Added Figure 8-9
Go
- Changed Equation 11 from: −600 to: −464Go
- Moved Device Functional Mode (Shutdown Mode) after Feature
DescriptionGo
- Updated Equation 16 to include comparator offset voltageGo
- Changed Equation 17 from: −600 to: −464Go
- Changed calculated RISCP value from: 1.32kΩ to: 1.46kΩGo
- Added Typical Application: Designing for EMIGo
- Changed from: Power Supply Recommendations to: Power Supply and EMI
RecommendationsGo
- Updated Figure 9-19 to include RSET and RISCP connectionGo
Changes from Revision C (December 2022) to Revision D (April 2024)
- Updated the DIODE sense TSD rising threshold,
T(DIODE_TSD_rising), specification in the Electrical Characteristics
sectionGo