SLUUD32A June 2024 – April 2025 BQ41Z50
This section highlights the benefits of IT-DZT under a dynamic load using the BQ41Z50 Evaluation module. The characteristics of the battery are shown in the table below. These parameters are crucial to configure the gauge as given in the previous sections.
| Cell Type | Li-Ion |
|---|---|
| Design Capacity | 4680mAh |
| Charging Volatge | 4430mV |
| Termination Voltage | 3000mV |
| Design Voltage | 3860mV |
The Data Memory configuration for this implementation is shown in the table below. These parameters ensure accurate gauging and IT-DZT functionality.
| [Gas Gauging][Current Thresholds][Dsg Current Threshold] | 100mA |
| [Gas Gauging][Current Thresholds][Chg Current Threshold] | 50mA |
| [Gas Gauging][IT Cfg][Term Voltage] | 8100mV |
| [Settings][Manufacturing][Mfg Status Init] | 18 |
| [Advanced Charge Algorithm][Termination Config][Charge Term Taper Current] | 269mA |
| [Gas Gauging][Design][Design Capacity mAh] | 4680mAh |
| [Gas Gauging][Design][Design Voltage] | 11580mV |
| [Gas Gauging][Design][Design Capacity cWh] | 5419cWh |
| [Gas Gauging][Current Thresholds][Quit Current Threshold] | 10mA |
Under [Settings][Configuration], set [Temperature Enable] to the right thermistor pin. In this example, the TS1 pin was used, so [Temperature Enable] was set to 2. The BQ41Z50EVM has 4 thermistors, which must be set based on the thermistor pin being used for the implementation. All unused TS pins must be disabled. Figure 5-8 shows the temperature enable register with the appropriate TS pins enabled.
Figure 5-8 Temperature Enable RegisterTS1 is the only thermistor seated on the battery and measuring cell temperature. Disable all other thermistor pins to prevent interference from other temperature readings. Under [Settings][Configuration][Temperature Mode], clear the TS1 mode bit to Cell Temperature mode and set all other TSn modes to FET Temperature mode.
Using the commands tab, reset the gauge to clear VOK and set RDIS temporarily. Ensure the cells are balanced before starting a cycle to avoid inaccurate Depth of Discharge (DoD), State of Charge (SoC) readings, or may even fail to get Qmax updates. It is recommended that RDIS is set during the first cycle to prevent the gauge from getting a resistance update before it gets a Qmax update.
This implementation utilized an Arbin battery tester to execute charge-discharge cycles according to predefined schedules. The custom schedule for this IT-DZT test encompasses charging, resting, discharging as well as a pulse load to simulate rapid charge and discharge sequences. Figure 5-9 below illustrates the charge-relax-discharge cycle. During the discharge routine, the Ra value updates, and the fluctuating load helps determine if the gauge accurately captures resistance changes. By monitoring these rapid transitions, it is possible to assess whether the gauge receives and processes resistance updates effectively, ensuring accurate performance under arbitrary load conditions.
Figure 5-9 Current and Voltage vs Elapsed Time