3 Device and Test Board Information

The TPS7H3014-SEP is packaged in a 24-pin TSSOP plastic package as shown in Figure 3-1. The TPS7H3014-SEP evaluation module was used to evaluate the performance and characteristics of the TPS7H3014-SEP under heavy ion radiation. The TPS7H3014EVM (Evaluation Module) is shown in Figure 3-2. The actual EVM BOM was modified from the original (or default) to set the EN_X to SENSE_X resistor divider to the correct values to attain the desired overdrive voltage on SENSE_X. Two different configurations were used during the heavy-ions test campaign, the details are provided on Figure 3-3 and Figure 3-4.

Figure 3-1 Photograph of Delidded TPS7H3014-SEP [Left] and Pinout Diagram [Right]

Note: The package was delidded to reveal the die face for all heavy-ion testing.

Figure 3-2 TPS7H3014-SEP EVM Top View

Figure 3-3 TPS7H3014-SEP EVM Schematic for DSEE Testing

Figure 3-4 TPS7H3014-SEP EVM Schematic for SET Testing