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TPS7H3014-SEP

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Radiation-tolerant, 14V four channel power supply sequencer

TPS7H3014-SEP

ACTIVE

Product details

Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
TSSOP (PW) 24 49.92 mm² (7.8 mm × 6.4 mm)
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

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Technical documentation

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Top documentation Type Title Format options Date
* Data sheet TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer datasheet (Rev. D) PDF | HTML Jul 27, 2025
* Radiation & reliability report TPS7H3014-SP and TPS7H3014-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) Jul 29, 2026
* Radiation & reliability report TPS7H3014-SEP Single-Event Effects (SEE) (Rev. A) PDF | HTML Aug 21, 2025
* Radiation & reliability report TPS7H3014-SEP Production Flow and Reliability Report PDF | HTML Jul 21, 2025
* Radiation & reliability report TPS7H3014-SEP Total Ionizing Dose (TID) Jul 16, 2025
* Radiation & reliability report TPS7H3014-SEP Neutron Displacement Damage (NDD) Characterization Report Jul 16, 2025
* VID TPS7H3014-SEP VID TPS7H3014-SEP VID V62-25644 Oct 27, 2025
Selection guide TI Space Products (Rev. L) Mar 27, 2026
Application note Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products (Rev. A) PDF | HTML Sep 15, 2022
E-book Radiation Handbook for Electronics (Rev. A) May 21, 2019

Design & development

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Evaluation board

TPS7H3014EVM — TPS7H3014-SEP evaluation module

The TPS7H3014 evaluation module (EVM) demonstrates the operation of a single TPS7H3014-SEP sequencer. The board provides footprints that can be populated with additional components to allow for testing of customized configurations, such as daisy-chained sequencers.

User guide: PDF | HTML
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Simulation model

TPS7H3014-SP and TPS7H3014-SEP PSpice Transient Model

SNVMCF1.ZIP (72 KB) - PSpice model
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TSSOP (PW) 24 Ultra Librarian

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