8 Single-Event Transients (SET)

The primary focus of SETs were heavy-ion-induced transient upsets on EN1, EN4, or FAULT. SET testing was done at room temperature using ¹⁰⁹Ag heavy-ions which produced a LET_EFF of 48 MeV·cm²/mg. The output signals were monitored by three NI PXIe-5172 scope cards. The PXIe-5172s were triggered with an edge-negative at –20% below the high voltage when in waiting to Sequence DOWN state. During the testing when the state machine was in the waiting to Sequence UP state, the trigger was set to 0.66V or 0.36V with an edge-positive trigger.

The PXIe-5172 sample rate was set to 100MS/s with a record length of 100k points (or samples). Two devices were tested under the loopback mode (for more details in loopback mode refer to footnote 1). In the loopback mode (used for SET) the overdrive voltage was selected to be ±20mV (typically). The device was tested under the following conditions.

1. Waiting to Sequence UP State (with –20mV).
2. Waiting to Sequence DOWN State (with+20mV).

The device was tested under a typical voltage for IN (5V) and PULL_UP_X (3.3V). Under these configurations not a single transient was recorded on EN1, EN4, or FAULT. This demonstrates the TPS7H3014-SEP is SET and SEFI free. The SET test conditions and results for three units are shown in Table 8-3.