SLVK198A July   2025  – August 2025 TPS7H3014-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References
  15.   B Revision History

10 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TPS7H3014-SEP. Heavy-ions with LETEFF = 48 MeV·cm2/mg were used for the SEE characterization campaign. Flux of ≈105 ions/cm2·s and fluences of ≈107 ions/cm2 per run were used for the characterization. The SEE results demonstrated that the TPS7H3014-SEP is free of destructive SEL and SEB/SEGR. The device also shown to be SET and SEFI free at LETEFF = 48 MeV·cm2/mg and across the full electrical specifications. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits for the DSEE and SET are presented for reference.