SLVK198A July   2025  – August 2025 TPS7H3014-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References
  15.   B Revision History

7.1 Single-Event Latch-Up (SEL) Results

During SEL characterization, the device was heated using a closed-loop PID controlled heat gun [MISTRAL 6 System (120V, 2400W)]. The DUT temperature was monitored prior to being irradiated with a FLIR IR-camera to ensure the junction temperature. The species used for SEL testing was 109Ag at both facilities. Incident angle was used which achieved an LETEFF of 48 MeV·cm2/mg at TAMU and 49.3 MeV·cm2/mg at KSEE.

Five devices were tested under the loopback mode (for more details in loopback mode refer to footnote 1). In the loopback mode (used for DSEE) the overdrive voltage was selected to be 1V. This was done to avoid interpreting a transient as a functional interrupt. All devices were tested in the Waiting to Sequence DOWN state. Maximum recommend voltages were used for VIN, VPULL_UPx and VUP. For more configuration information please refer to Table 6-1.

Not a single functional interrupt was observed, nor was there any high current event on any of the power supplies of the TPS7H3014-SEP. A total of five units were tested under the same conditions and configuration. This indicates the TPS7H3014-SEP is SEL-free. The results for five runs across five devices are shown in Table 8-3. A typical VIN current versus time plot during a SEL run is shown in Figure 7-1.

Table 7-1 Summary of TPS7H3014-SEP SEL Test Condition and Results
RUN #UNIT #

FACILITY

IONLETEFF (MeV·cm2/mg)

FLUX

(ions·cm2/mg·s)

FLUENCE

(ions·cm2/mg)

SEL

(NUMBER OF EVENTS)
11

TAMU

109Ag

48

1.18 × 105

1.00 × 107

0

22

TAMU

109Ag

48

1.21 × 105

1.00 × 107

0

33

TAMU

109Ag

48

1.43 × 105

1.00 × 107

0

14

6

KSEE

109Ag

49.3

1.10 × 105

1.00 × 107

0

15

7

KSEE

109Ag

49.3

7.46 × 1041.00 × 107

0

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluence of the five runs at 125°C (5 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEL ≤ 7.38 × 10–8 cm2/device for LETEFF = 48 MeV·cm2/mg and T = 125°C.

TPS7H3014-SEP Current versus Time for IIn: Run #1 of the TPS7H3014-SEP at T = 125°CFigure 7-1 Current versus Time for IIn: Run #1 of the TPS7H3014-SEP at T = 125°C