SLVUD73 April 2025 TPS7H3014-SEP , TPS7H3014-SP
Primary Device | Secondary Device | ||||
|---|---|---|---|---|---|
Designator | Function | Designator | Function | ||
J10 | VIN_P | Power input connector for VIN of the primary device. | R42 | VIN_S | 0 Ohm resistor for tying VIN of the primary and secondary devices. |
TP3 | Test point | TP22 | Test point | ||
J5 | PULL_UP1_P | Power input connector for PULL_UP1 of the primary device. | R41 | PULL_UP1_S | 0 Ohm resistor for tying PULL_UP1 of the primary and secondary devices. |
TP5 | Test point | TP24 | Test point | ||
J2 | PULL_UP2_P | Power input connector for PULL_UP2 of the primary device. | R38 | PULL_UP2_S | 0 Ohm resistor for tying PULL_UP2 of the primary and secondary devices. |
TP7 | Test point | TP35 | Test point | ||
J6, J23 | GND | Power input connector for GND of the primary device. | GND power connections are shared between primary and secondary devices. | ||
TP26, TP27, TP28, TP29, TP30, TP31, TP32, TP33 | Test point | ||||
J24 | VOUT1_P | Input connector for an external VOUT rail to be monitored by SENSE1 of the primary device. | J55 | VOUT1_S | Input connector for an external VOUT rail to be monitored by SENSE1 of the secondary device. |
J31 | GND | J62 | GND | ||
J28 | SENSE1_P | Probe test point | J57 | SENSE1_S | |
TP13 | Test point | TP38 | Test point | ||
J25 | VOUT2_P | Input connector for an external VOUT rail to be monitored by SENSE2 of the primary device. | J56 | VOUT2_S | Input connector for an external VOUT rail to be monitored by SENSE2 of the secondary device. |
J32 | GND | J63 | GND | ||
J29 | SENSE2_P | Probe test point | J58 | SENSE2_S | Probe test point |
TP14 | Test point | TP39 | Test point | ||
J33 | VOUT3_P | Input connector for an external VOUT rail to be monitored by SENSE3 of the primary device. | J65 | VOUT3_S | Input connector for an external VOUT rail to be monitored by SENSE3 of the secondary device. |
J39 | GND | J70 | GND | ||
J37 | SENSE3_P | Probe test point | J68 | SENSE3_S | Probe test point |
TP18 | Test point | TP45 | Test point | ||
J34 | VOUT4_P | Input connector for an external VOUT rail to be monitored by SENSE4 of the primary device. | J66 | VOUT4_S | Input connector for an external VOUT rail to be monitored by SENSE4 of the secondary device. |
J40 | GND | J71 | GND | ||
J38 | SENSE4_P | Probe test point | J69 | SENSE4_S | Probe test point |
TP19 | Test point | TP46 | Test point | ||
TP1 | EN1_P | Test point | TP20 | EN1_S | Test point |
J3 | Probe test point | J42 | Probe test point | ||
J1 | Output connector for EN1 of the primary device. | J41 | Output connector for EN1 of the secondary device. | ||
J4 | GND | J43 | GND | ||
TP2 | EN2_P | Test point | TP21 | EN2_S | Test point |
J8 | Probe test point | J45 | Probe test point | ||
J7 | Output connector for EN2 of the primary device. | J44 | Output connector for EN2 of the secondary device. | ||
J9 | GND | J46 | GND | ||
TP4 | EN3_P | Test point | TP23 | EN3_S | Test point |
J12 | Probe test point | J48 | Probe test point | ||
J11 | Output connector for EN3 of the primary device. | J47 | Output connector for EN3 of the secondary device. | ||
J13 | GND | J49 | GND | ||
TP8 | EN4_P | Test point | TP34 | EN4_S | Test point |
J18 | Probe test point | J51 | Probe test point | ||
J14 | Output connector for EN4 of the primary device. | J50 | Output connector for EN4 of the secondary device. | ||
J22 | GND | J52 | GND | ||
J15, J16, J17 | DLY_TMR_P | Shunt for DLY_TMR resistor configuration of the primary device. | J53 | DLY_TMR_S | Shunt for DLY_TMR resistor configuration of the secondary device. |
J19, J20, J21 | REG_TMR_P | Shunt for REG_TMR resistor configuration of the primary device. | J54 | REG_TMR_S | Shunt for REG_TMR resistor configuration of the secondary device. |
TP11 | UP_P | Test point | TP41 | UP_S | Test point |
J26 | Probe test point | J60 | Probe test point | ||
TP17 | DOWNb_P | Test point | TP42 | DOWNb_S | Test point |
J36 | Probe test point | J61 | Probe test point | ||
TP6 | HYS_P | Test point | TP25 | HYS_S | Test point |
TP15 | FAULTb_P | Test point | TP43 | FAULTb_S | Test point |
J30 | Probe test point | J64 | Probe test point | ||
TP16 | SEQ_DONE_P | Test point | TP44 | SEQ_DONE_S | Test point |
J35 | Probe test point | J67 | Probe test point | ||
TP12 | PWRGD_P | Test point | TP40 | PWRGD_S | Test point |
J27 | Probe test point | J59 | Probe test point | ||
TP9 | VLDO_P | Test point | TP36 | VLDO_S | Test point |
TP10 | REFCAP_P | Test point | TP37 | REFCAP_S | Test point |
TP47 | RESET | Test point | External RESET will apply to both the primary and secondary device. | ||