SNAA406B August   2024  – May 2025 LMK6C

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction and Test Methodology
  5. 2Simulation Setup
  6. 3Routing Topologies and Simulation Results
    1. 3.1 Single-Line
    2. 3.2 Star Line
    3. 3.3 Split Line
    4. 3.4 Star Line vs. Split Line
  7. 4Lab Measurements
    1. 4.1 Lab Measurement Setup
    2. 4.2 Lab Measurement Results and Correlation to Simulation Data
  8. 5Trace Length Mismatch Between Loads
  9. 6Application Example: FPD-Link
  10. 7Summary
  11. 8References
  12. 9Revision History

Lab Measurement Results and Correlation to Simulation Data

The board layout parameters were extracted and a signal integrity simulation was ran in Hyperlynx using the same procedure described in Section 2 with a 2pF load capacitance at each output. The measurements collected with this board and a comparison with the predicted values based on simulation results are given below.

Table 4-1 Rise or Fall Time and Jitter Results for Different Routing Topologies on Multi-Load Board
Trace Type Trace Description Jitter (fs) Measurement Rise time (ps) Measurement Fall time (ps) Measurement Rise time (ps) Simulation Fall time (ps) Simulation
1 2” Single with 1 via 335 250 263 263 245
2 2” Single with 2 vias 335 249 257 270 266
3 1” Single with no via 333 238 254 277 204
4 2” Single with no via 334 251 259 263 244
5 2” Double split near driver 336 1780 1870 1475 1640
6 2” Double split near load 332 1283 1422 1050 1190
7 2” Triple split near driver 350 2895 3023 2904 3180
8 2” Triple split near load 350 2051 2210 1715 1990
9 1.5” Triple split near load 349 1693 1837 1248 1420
10 1.6” Quadruple split near load 376 2385 2380 1796 2080

From the results shown in Table 4-1, the trace routing topology had very little impact on jitter performance. Note that jitter measurements were taken with a phase noise analyzer that contains an internal 50Ω termination, which reduces reflections measured at the receiver compared to a high-impedance, purely capacitive load. The rise/fall time trends of the simulated measurements closely correlate with the lab measurements. Trace numbering of the x-axis in Figure 4-2 corresponds to the same numbering scheme used in Table 4-1 and the labels on Figure 4-1. Simulation results become less closely coupled compared to the lab measurements as the routing fanout increases. This is mainly the result of unmodeled parasitic capacitances of the SMA adapters, cables, and probes in the test setup. Based on this correlation from lab measurements vs. simulation data, you can expect the simulation rise/fall time results to match the real measurement results within ±25% margin. This margin accounts for part-to-part variation, PCB manufacturing tolerances of the copper pour thickness affecting parasitic capacitance and characteristic trace impedance, and other environmental factors. To summarize, system designers can use IBIS simulations to confidently estimate the rise/fall time and signal integrity of clock signals for different routing schemes when driving multiple loads.

Output amplitude maintained rail-to-rail specifications in all routing topologies with a 2pF load, but can be degraded as the number of loads or total load capacitance increases. In both the simulations and real lab measurements, routing with the split near the load (star-line topology) results in better performance.

 Simulation vs. Measurement:
                    Averaged Rise or Fall Time Results with Different Routing Topologies on
                    Multi-Load Board Figure 4-2 Simulation vs. Measurement: Averaged Rise or Fall Time Results with Different Routing Topologies on Multi-Load Board