SNOS746G May   2004  – December 2025 LMC7211-N

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Specifications
    1. 4.1 Absolute Maximum Ratings
    2. 4.2 Operating Ratings
    3. 4.3 2.7V Electrical Characteristics
    4. 4.4 5.0V and 15.0V Electrical Characteristics
    5. 4.5 AC Electrical Characteristics
    6. 4.6 Typical Characteristics
  6. 5Application Information
    1. 5.1 Benefits of the LMC7211-N Tiny Comparator
    2. 5.2 Low Voltage Operation
    3. 5.3 Output Short Circuit Current
    4. 5.4 Hysteresis
    5. 5.5 Input Protection
    6. 5.6 Layout Considerations
    7. 5.7 Open Drain Output, Dual Versions
    8. 5.8 Additional SOT23-5 Tiny Devices
    9. 5.9 Spice Macromodel
  7. 6Device and Documentation Support
    1. 6.1 Receiving Notification of Documentation Updates
    2. 6.2 Support Resources
    3. 6.3 Trademarks
    4. 6.4 Electrostatic Discharge Caution
    5. 6.5 Glossary
  8. 7Revision History
  9. 8Mechanical, Packaging, and Orderable Information

6.4 Electrostatic Discharge Caution

LMC7211-N This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.