SN74AUP1G17

• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
• ESD Performance Tested Per JESD 22
  • 2000-V Human-Body Model
    (A114-B, Class II)
  • 1000-V Charged-Device Model (C101)
• Available in the Texas Instruments NanoStar™ Package
• Low Static-Power Consumption
  (I_CC = 0.9 µA Maximum)
• Low Dynamic-Power Consumption
  (C_pd = 4.4 pF Typical at 3.3 V)
• Low Input Capacitance (C_i = 1.5 pF Typical)
• Low Noise – Overshoot and Undershoot
  <10% of V_CC
• I_off Supports Partial-Power-Down Mode Operation
• Includes Schmitt-Trigger Inputs
• Wide Operating V_CC Range of 0.8 V to 3.6 V
• Optimized for 3.3-V Operation
• 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
• t_pd = 5.1 ns Maximum at 3.3 V
• Suitable for Point-to-Point Applications

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The AUP family of devices is TI’s premier solution to the industry’s low-power needs in battery-powered portable applications. This family ensures a very low static- and dynamic-power consumption across the entire V_CC range of 0.8 V to 3.6 V, resulting in increased battery life. This product also maintains excellent signal integrity (see AUP – The Lowest-Power Family and Excellent Signal Integrity).

This device functions as an independent gate with Schmitt-trigger inputs, which allows for slow input transition and better switching-noise immunity at the input.

NanoStar™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

This device is fully specified for partial-power-down applications using I_off. The I_off circuitry disables the outputs when the device is powered down. This inhibits current backflow into the device which prevents damage to the device.