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TPS7H1121-SP

ACTIVO

Radiation-hardened, QML-V, 2.25V to 14V input, 2A low-dropout (LDO) regulator

Detalles del producto

Rating Space Vin (max) (V) 14 Vin (min) (V) 2.25 Iout (max) (A) 2 Output options Adjustable Output Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Features Adjustable current limit, Enable, Power good, Soft start Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
Rating Space Vin (max) (V) 14 Vin (min) (V) 2.25 Iout (max) (A) 2 Output options Adjustable Output Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Features Adjustable current limit, Enable, Power good, Soft start Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
CFP (HFT) 22 60.221856 mm² (6.211 mm × 9.696 mm)
  • Total Ionizing Dose radiation characterized:
    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range
  • Total Ionizing Dose radiation characterized:
    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. The device is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. The device is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.

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Documentación técnica

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Documentación principal Tipo Título Opciones de formato Descargar la versión más reciente en inglés Fecha
* Hoja de datos TPS7H1121-SP and TPS7H1121-SEP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator datasheet (Rev. C) PDF | HTML 3/11/2025
* Informe de radiación y confiabilidad TPS7H1121-SP Total Ionizing Dose (TID) Radiation Report (Rev. A) 13/02/2026
* Informe de radiación y confiabilidad TPS7H1121-SP Neutron Displacement Damage (NDD) Characterization Report PDF | HTML 19/09/2024
* Informe de radiación y confiabilidad TPS7H1121-SP Single-Event Effects (SEE) PDF | HTML 18/09/2024
* SMD TPS7H1121-SP SMD 5962-23203 16/12/2024
Informe IC Sourcing for Space: Pros and Cons of Up-screening COTS Versus Space Enhanced Products (SEP) PDF | HTML 28/07/2026
Nota sobre la aplicación Highly Scalable Space Motor Control Platform based on TI’s Space Enhanced Products (-SEP) and Space Products PDF | HTML 8/06/2026
Guía de selección TI Space Products (Rev. L) 27/03/2026
Nota sobre la aplicación Hermetic Package Reflow Profiles, Termination Finishes, and Lead Trim and Form (Rev. A) PDF | HTML 5/11/2025
Application brief DLA Approved Optimizations for QML Products (Rev. C) PDF | HTML 17/06/2025
Nota sobre la aplicación Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. B) PDF | HTML 10/06/2025
Más documentación TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. B) 20/02/2025
Certificado TPS7H1121EVM-CVAL EU Declaration of Conformity (DoC) 5/04/2024
Nota sobre la aplicación QML flow, its importance, and obtaining lot information (Rev. C) 30/08/2023
Nota sobre la aplicación Single-Event Effects Confidence Interval Calculations (Rev. A) PDF | HTML 19/10/2022
Nota sobre la aplicación DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 21/08/2020
Libro electrónico Radiation Handbook for Electronics (Rev. A) 21/05/2019

Diseño y desarrollo

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Placa de evaluación

TPS7H1121EVM-CVAL — Módulo de evaluación TPS7H1121-SP

El TPS7H1121EVM-CVAL muestra el funcionamiento de un único regulador de tensión de caída baja (LDO) TPS7H1121-SP. La placa proporciona huellas que se pueden rellenar con componentes adicionales para permitir la prueba de configuraciones personalizadas, así como puntos de prueba y conectores SMA (...)
Guía del usuario: PDF | HTML
Productos y hardware compatibles
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Modelo de simulación

TPS7H1121-SP PSpice Model

SLVME97.ZIP (36 KB) - Modelo PSpice
Productos y hardware compatibles
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
CFP (HFT) 22 Ultra Librarian

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