SN74HC02-EP

Name: SN74HC02-EP
Brand: TI
SKU: SN74HC02-EP
Price: 0.858 USD

활성

향상된 제품 4채널, 2입력, 2V~6V NOR 게이트

지금 주문

데이터 시트

document-pdfAcrobat SN74HC02-EP datasheet (Rev. A) (영어)

SN74HC02-EP

활성

데이터 시트

지금 주문

제품 상세 정보

Technology family

HC

Number of channels

4

Supply voltage (min) (V)

2

Supply voltage (max) (V)

6

Inputs per channel

2

IOL (max) (mA)

4

IOH (max) (mA)

-4

Output type

Push-Pull

Input type

Standard CMOS

Features

High speed (tpd 10- 50ns)

Data rate (max) (Mbps)

28

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-40 to 125

Technology family

HC

Number of channels

4

Supply voltage (min) (V)

2

Supply voltage (max) (V)

6

Inputs per channel

2

IOL (max) (mA)

4

IOH (max) (mA)

-4

Output type

Push-Pull

Input type

Standard CMOS

Features

High speed (tpd 10- 50ns)

Data rate (max) (Mbps)

28

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-40 to 125

TSSOP (PW)

14

32 mm² 5 x 6.4

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of Up To –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
2-V to 6-V V_CC Operation
Outputs Can Drive Up To 10 LSTTL Loads
Low Power Consumption, 20-µA Max ICC
Typical t_pd = 8 ns
±4-mA Output Drive at 5 V
Low Input Current of 1 µA Max

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of Up To –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
2-V to 6-V V_CC Operation
Outputs Can Drive Up To 10 LSTTL Loads
Low Power Consumption, 20-µA Max ICC
Typical t_pd = 8 ns
±4-mA Output Drive at 5 V
Low Input Current of 1 µA Max

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74HC02 contains four independent 2-input NOR gates. It performs the Boolean function Y = (A + B)\ or Y = A\ • B\ in positive logic.

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기타 NOR 게이트 찾기

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